火花试验装置如何适应集成电路的发展  

How the Spark Test Devices Adapt to the Development of Integrated Circuits

作　　者：汝长青 Ru Chang-qing(Shanghai Institute of Quality Supervision and Inspection Technology,Shanghai 201114;National Lighting Quality Inspection and Testing Center,Shanghai 201114)

机构地区：[1]上海市质量监督检验技术研究院,上海201114 [2]国家灯具质量检验检测中心,上海201114

出　　处：《电气防爆》2024年第5期42-44,共3页Electric Explosion Protection

摘　　要：火花试验装置作为本质安全型防爆技术重要的型式检验环节,阐述了火花试验装置如何满足集成电路的飞速发展。Spark test device,as an important type inspection link of intrinsically safe explosion-proof technology,it explains how to meet the rapid development of integrated circuit.

关 键 词：本质安全型 点燃概率 集成电路 

分 类 号：U260.422[机械工程—车辆工程]