基于多应力加速退化的机载电子部件可靠性试验方法  

Reliability test method of airborne electronic components based on multi-stress accelerated degradation

作　　者：王鹏[1,4] 田润操 杜洪光 丛玮 张帆 于光[5] 杨吕珊 WANG Peng;TIAN Runcao;DU Hongguang;CONG Wei;ZHANG Fan;YU Guang;YANG Lyushan(Research Institute of Science and Technology Innovation,CAUC,Tianjin 300300,China;College of Safety Science and Engineering,CAUC,Tianjin 300300,China;College of Electronic Information and Automation,CAUC,Tianjin 300300,China;Key Laboratory of Airworthiness Certification Technology for Civil Aviation Aircraft,Tianjin 300300,China;Xinjiang Branch of Engineering and Technology Affiliate of China Southern Airlines Co.,Ltd.,Urumqi 830000,China;Production and Technology Department of Wuhan Branch of China Eastern Airlines Technology Co.,Ltd.,Wuhan 430000,China)

机构地区：[1]中国民航大学科技创新研究院,天津300300 [2]中国民航大学安全科学与工程学院,天津300300 [3]中国民航大学电子信息与自动化学院,天津300300 [4]民航航空器适航审定技术重点实验室,天津300300 [5]中国南方航空股份有限公司工程技术分公司新疆分部,乌鲁木齐830000 [6]中国东方航空技术有限公司武汉分公司生产技术部,武汉430000

出　　处：《中国民航大学学报》2024年第5期1-8,共8页Journal of Civil Aviation University of China

基　　金：国家重点研发计划项目(2021YFB160061)。

摘　　要：可靠性试验是获取基础安全性数据的重要来源之一。考虑机载设备的实际工作环境,多种应力共同作用导致产品失效且存在复杂的相互作用,本文提出一种基于多应力广义耦合加速退化的可靠性试验方法,可以直接获取用于适航符合性验证的基础安全性数据。首先,建立考虑多应力广义耦合的非线性Wiener加速退化模型,结合相关性分析确定应力耦合形式;其次,提出基于多应力加速退化模型的最大似然估计与参数优化方法,解决多参数估计难题;最后,以某机载LED芯片为对象开展三应力加速退化试验,实现寿命评估。结果表明,相比于传统多应力加速模型,本文所提方法更贴近实际工况,误差控制在1%以内,寿命评估精度较高,可以有效解决基础数据缺失和不准确的现实适航问题。The reliability test is one of the important sources to obtain the basic safety data.Considering the actual working environment of airborne equipment,where multiple stress act together to cause product failure and there are complex interaction,a reliability test method based on accelerated degradation of multi-stress generalized coupling is proposed in this paper,which can directly obtain the basic safety data for airworthiness compliance verification.Firstly,a nonlinear Wiener accelerated degradation model considering multi-stress generalized coupling is established,and the form of stress coupling is determined by combining correlation analysis.Secondly,maximum likelihood estimation and parameter optimization method based on the multi-stress accelerated degradation model is proposed to solve the problem of multi-parameter estimation.Finally a three-stress accelerated degradation test is carried out with an airborne LED chip as the object to realize the life assessment.The results show that,compared with the traditional multi-stress accelerated model,the proposed method is closer to the actual working condition,and the error is controlled within 1%,and the accuracy of life assessment is high,which can effectively solve the real airworthiness problem of missing and inaccurate of basic data.

关 键 词：适航审定 民机系统安全性评估 基础安全性数据 加速试验技术 多应力耦合 

分 类 号：V240.2[航空宇航科学与技术—飞行器设计]