薄膜/衬底系统中随机缺陷的敏感性研究  

Sensitivity of Structures to Random Defects in Film-substrate Systems

作　　者：赖安迪 廖军 欧迪 付果 Andi Lai;Jun Liao;Di Ou;Guo Fu(Department of Mechanics,School of Civil Engineering,Changsha University of Science and Technology,Changsha,410114)

机构地区：[1]长沙理工大学土木工程学院力学系,长沙410114

出　　处：《固体力学学报》2024年第5期652-664,共13页Chinese Journal of Solid Mechanics

基　　金：长沙理工大学桥梁与隧道工程创新性项目(11ZDXK11);湖南省研究生科研创新项目(CSLGCX23146)资助。

摘　　要：由于原材料的差异和制造工艺的复杂性,工程结构中难以避免地存在随机缺陷.考虑到薄膜/衬底系统对缺陷的敏感性,本文采用Monte-Carlo法对随机缺陷结构的稳定性进行统计分析,并结合数值模拟探讨含随机缺陷的薄膜/衬底系统在失稳下的形貌演化和后屈曲平衡路径.数值结果表明,随机缺陷结构的临界载荷呈现不稳定性,其中缺陷显著降低了结构的临界载荷,随机缺陷破坏了结构的对称性,使有序的棋盘状图案转化成无序的褶皱核图案并影响了后续的形貌走势.该研究评估了薄膜结构中随机缺陷的潜在风险和影响,旨在提高薄膜器件、涂层和表面处理的可靠性和性能,同时缩小稳定性理论研究成果与实际设计应用之间的差距.Random defects due to differences in raw materials and the complexity of the manufacturing process are inevitable in engineering structures.Based on the inherent characteristics of sensitivity to defects in the film-substrate system,the Monte Carlo method is applied in the study of the stability of structures with random defects,coupled with numerical simulations to investigate the morphological evolution and post-buckling equilibrium path of film-substrate systems with random defects during instability.The numerical results show that the critical load of the structure with random defects is unstable.The defects significantly reduce the critical load of the structure,and the random defects destroy the symmetry of the structure,leading to a transformation from an ordered checkerboard pattern to a disordered fold nuclear pattern,hence affecting the subsequent morphological trend.This analysis assesses the potential risks and effects of random defects in thin-film structures,aiming to improve the reliability and performance of thin-film devices,coatings and surface treatments,and to bridge the gap between theoretical stability research findings and practical design applications.

关 键 词：随机缺陷 缺陷敏感性 形貌演化 后屈曲 稳定性 

分 类 号：TB33[一般工业技术—材料科学与工程]