热释光动力学解析及其在长余辉材料研究中的应用  

Thermoluminescence Dynamics Analysis and Its Application in Study of Persistent Luminescence Materials

作　　者：文载盛 张世有 白欣 宋振[1] 刘泉林[1] WEN Zaisheng;ZHANG Shiyou;BAI Xin;SONG Zhen;LIU Quanlin(School of Materials Science&Engineering,University of Science and Technology Beijing,Beijing 100083,China)

机构地区：[1]北京科技大学材料科学与工程学院,北京100083

出　　处：《发光学报》2024年第11期1782-1793,共12页Chinese Journal of Luminescence

基　　金：国家自然科学基金(52372134,12274023);中央高校基本科研业务费专项资金(FRF-EYIT-23-04)。

摘　　要：热释光测试是长余辉材料研究中最重要的测试项目。材料在受到激发(紫外光、X射线和可见光等照射)时,电子被陷阱捕获,这些电子在热激励作用下被释放然后与发光中心复合进而产生长余辉发光。近几年,研究者对长余辉材料在生物成像、辐射剂量探测和防伪等领域展开了大量研究,长余辉材料成为发光材料研究的热点。余辉衰减过程中热能起到了关键作用。本文介绍了能带模型以及热释光“一级”、“二级”和“通用级”动力学方程,总结了常用的几种陷阱深度估算方法,并介绍了最近我们改进的热释光峰位联合加热速率估算法。Thermoluminescence measurement is the most important test item in the study of persistent lumines⁃cence materials.When the material is excited by high-energy rays,electrons are trapped in the trap,and these elec⁃trons are released under thermal excitation and then combined with the luminescent center,resulting in persistent lu⁃minescence.In recent years,researchers have carried out a lot of research on persistent luminescence materials in the fields of biological imaging,radiation dose detection and anti-counterfeiting.Thermal energy plays a key role in the decay of persistent luminescence.This paper will introduce the energy band model and thermoluminescence“first”,“second”,and“general”kinetic equations,and summarize several commonly used trap depth estimation methods,as well as our recently proposed simpler and more accurate trap depth estimation methods.

关 键 词：热释光 长余辉 

分 类 号：O482.31[理学—固体物理]