OML:an online multi-particle locating method for high-resolution single-event effects studies  

作　　者：Yan-Hao Jia Jian-Wei Liao Hai-Bo Yang Qi-Hao Duan Long-Jie Wang Jiang-Yong Du Hong-Lin Zhang Cheng-Xin Zhao 

机构地区：[1]Institute of Modern Physics,Chinese Academy of Sciences,Lanzhou 730000,China [2]Advanced Energy Science and Technology Guangdong Laboratory,Huizhou 516003,China [3]University of Chinese Academy of Sciences,Beijing 100049,China [4]Northwest Normal University,Lanzhou 730070,China

出　　处：《Nuclear Science and Techniques》2024年第11期61-72,共12页核技术（英文）

基　　金：supported by the National Natural Science Foundation of China(Nos.U2032209,12222512,12375193,12305210);the National Key Research and Development Program of China(No.2021YFA1601300);the CAS“Light of West China”Program,the CAS Pioneer Hundred Talent Program,the Guangdong Major Project of Basic and Applied Basic Research(No.2020B0301030008).

摘　　要：Identifying sensitive areas in integrated circuits susceptible to single-event effects(SEE)is crucial for improving radiation hardness.This study presents an online multi-track location(OML)framework to enhance the high-resolution online trajectory detection for the Hi’Beam-SEE system,which aims to localize SEE-sensitive positions on the IC at the micrometer scale and in real time.We employed a reparameterization method to accelerate the inference speed,merging the branches of the backbone of the location in the deployment scenario.Additionally,we designed an irregular convolution kernel,an attention mechanism,and a fused loss function to improve the positioning accuracy.OML demonstrates exceptional realtime processing capabilities,achieving a positioning accuracy of 1.83μm in processing data generated by the Hi’Beam-SEE system at 163 frames per second per GPU.

关 键 词：Single-event effects Integrated circuits Silicon pixel Sensors Artificial intelligence Gaseous detector 

分 类 号：V443[航空宇航科学与技术—飞行器设计] TN40[电子电信—微电子学与固体电子学] TL81[核科学技术—核技术及应用]