Atomic-level quantitative analysis of electronic functional materials by aberration-corrected STEM  

作　　者：Wanbo Qu Zhihao Zhao Yuxuan Yang Yang Zhang Shengwu Guo Fei Li Xiangdong Ding Jun Sun Haijun Wu 曲万博;赵志昊;杨宇轩;张杨;郭生武;李飞;丁向东;孙军;武海军(State Key Laboratory for Mechanical Behavior of Materials,Xi'an Jiaotong University,Xi'an 710049,China;Electronic Materials Research Laboratory,Key Laboratory of the Ministry of Education,and School of Electronic and Information Engineering,Xi'an Jiaotong University,Xi'an 710049,China;Instrumental Analysis Center of Xi'an Jiaotong University,Xi'an Jiaotong University,Xi'an 710049,China)

机构地区：[1]State Key Laboratory for Mechanical Behavior of Materials,Xi'an Jiaotong University,Xi'an 710049,China [2]Electronic Materials Research Laboratory,Key Laboratory of the Ministry of Education,and School of Electronic and Information Engineering,Xi'an Jiaotong University,Xi'an 710049,China [3]Instrumental Analysis Center of Xi'an Jiaotong University,Xi'an Jiaotong University,Xi'an 710049,China

出　　处：《Chinese Physics B》2024年第11期12-25,共14页中国物理B（英文版）

基　　金：Project supported by the financial support from the National Key R&D Program of China(Grant No.2021YFB3201100);the National Natural Science Foundation of China(Grant No.52172128);the Top Young Talents Programme of Xi’an Jiaotong University.

摘　　要：The stable sub-angstrom resolution of the aberration-corrected scanning transmission electron microscope(ACSTEM)makes it an advanced and practical characterization technique for all materials.Owing to the prosperous advancement in computational technology,specialized software and programs have emerged as potent facilitators across the entirety of electron microscopy characterization process.Utilizing advanced image processing algorithms promotes the rectification of image distortions,concurrently elevating the overall image quality to superior standards.Extracting high-resolution,pixel-level discrete information and converting it into atomic-scale,followed by performing statistical calculations on the physical matters of interest through quantitative analysis,represent an effective strategy to maximize the value of electron microscope images.The efficacious utilization of quantitative analysis of electron microscope images has become a progressively prominent consideration for materials scientists and electron microscopy researchers.This article offers a concise overview of the pivotal procedures in quantitative analysis and summarizes the computational methodologies involved from three perspectives:contrast,lattice and strain,as well as atomic displacements and polarization.It further elaborates on practical applications of these methods in electronic functional materials,notably in piezoelectrics/ferroelectrics and thermoelectrics.It emphasizes the indispensable role of quantitative analysis in fundamental theoretical research,elucidating the structure–property correlations in high-performance systems,and guiding synthesis strategies.

关 键 词：AC-STEM quantitative analysis POLARIZATION electronic functional materials 

分 类 号：TN16[电子电信—物理电子学] O469[理学—凝聚态物理] TP391.41[理学—电子物理学]