Experimental Evaluation of Individual Hotspots of a Multicore Microprocessor Using Pulsating Heat Sources  

作　　者：Rodrigo Vidonscky Pinto Flávio Augusto Sanzovo Fiorelli 

机构地区：[1]Department of Mechanical Engineering,University Centre of United Metropolitan Faculties,Sao Paulo,Brazil [2]Department of Mechanical Engineering,University of Sao Paulo,Sao Paulo,Brazil

出　　处：《Frontiers in Heat and Mass Transfer》2023年第1期427-442,共16页热量和质量传递前沿（英文）

摘　　要：The present work provides an experimental and numerical procedure to obtain the geometrical position of the hotspots of a microprocessor using the thermal images obtained from the transient thermal response of this processor subject to pulsating stress tests.This is performed by the solution of the steady inverse heat transfer problem using these thermal images,resulting in qualitative heat source distributions;these are analyzed using the mean heat source gradients to identify the elements that can be considered hotspots.This procedure identified that the processor INTEL Core 2 Quad Q8400S contains one hotspot located in the center of its left die and four hotspots located near the lower left corner of its right die,which is consistent with the thermal response obtained for both the stress test applied to each core of this processor and the stress test applied to all of its cores.

关 键 词：Inverse heat transfer HOTSPOTS thermal imaging 

分 类 号：TP332[自动化与计算机技术—计算机系统结构]