检索规则说明:AND代表“并且”;OR代表“或者”;NOT代表“不包含”;(注意必须大写,运算符两边需空一格)
检 索 范 例 :范例一: (K=图书馆学 OR K=情报学) AND A=范并思 范例二:J=计算机应用与软件 AND (U=C++ OR U=Basic) NOT M=Visual
作 者:童颜 刘克明 莫申扬 骆健 周国华 邓二平 Tong Yan;Liu Keming;Mo Shenyang;Luo Jian;Zhou Cuohua;Deng Erping(NARI Group(State Grid Electrical Science Institute)Co.,Ltd.,Nanjing 211106,China;Nanjing NARI Semiconductor Co.,Ltd.,Nanjing 210016,China;State Grid Zhejiang Hangzhou Xiaoshan Electric Power Company,Hangzhou 310016;State Key Laboratory of High-Efficiency and High-Quality Conversion for Electric Power(Hefei University of Technology),Hefei 230009,China)
机构地区:[1]南瑞集团(国网电力科学研究院)有限公司,南京211106 [2]南京南瑞半导体有限公司,南京210016 [3]国网浙江省电力有限公司杭州市萧山区供电公司,杭州310016 [4]电能高效高质转化全国重点实验室(合肥工业大学),合肥230009
出 处:《半导体技术》2024年第12期1090-1096,共7页Semiconductor Technology
基 金:国家电网有限公司总部管理科技项目(5108-202218280A-2-110-XG)。
摘 要:压接型IGBT器件的失效短路模式(SCFM)可使其在失效之后仍能保持短路特性,在大规模器件串联应用中具有非常独特的优势,能够显著提高基于电压源换流器的高压直流(VSC-HVDC)(柔性直流)输电领域电力电子设备的可靠性。弹性压接器件由于封装结构限制,很难实现长期稳定运行。提出了一种新型弹性压接封装结构,采用失效短路电流再分配的方案,通过理论分析、仿真对比、试验测试等手段对该方案进行失效短路能力评估,相较传统结构导电片在1900 A、1 min熔断,优化后的导电片在2250 A、2 h下能够稳定保持最高温度≤200℃,为压接器件的开发提供了新的研究方向。The short circuit failure mode(SCFM)of the press-pack IGBT devices allows them to maintain the short circuit characteristic after failure,which is a very unique advantage in the large-scale device series applications,and can significantly improve the reliability of power electronic equipment in the field of voltage source converter based high voltage direct current(VSC-HVDC)transmission.Elastic press-pack device is difficult to maintain long-term stable operation due to the limitation of package structure.A new elastic press-pack package structure that adopted a failure short circuit current redistribution scheme was presented.Through theoretical analysis,simulation comparison and experimental testing,the short circuit failure capability of the scheme was evaluated.The optimized conductor can maintain a stable maximum temperature of≤200 ℃ at 2250 A for 2 h while the traditional conductor burns down at 1900 A for 1 min.It provides a new research direction for the development of press-pack devices.
关 键 词:压接型IGBT器件 弹性压接 失效短路模式(SCFM) 电流再分配 长期稳定运行
分 类 号:TN386.2[电子电信—物理电子学] TN305.94
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在载入数据...
正在链接到云南高校图书馆文献保障联盟下载...
云南高校图书馆联盟文献共享服务平台 版权所有©
您的IP:216.73.216.7