XRF法测定涂料用钛白粉中元素含量的研究  

X-ray Fluorescence Spectrometry for the Determination of Six Elements in Titanium Dioxide

作　　者：金琦春 王晓格 郑姝倩 张广宇 JIN Qi-chun;WANG Xiao-ge;ZHENG Shu-qian;ZHANG Guang-yu(Zhejiang Fangyuan Test Group Co.,Ltd.,Hangzhou 310018,Zhejiang,China)

机构地区：[1]浙江方圆检测集团股份有限公司,杭州310018

出　　处：《中国涂料》2024年第8期59-63,68,共6页China Coatings

摘　　要：研究采用压片制样-X射线荧光光谱测定技术,使用9种配制钛白粉作为校准样本,建立了一种能够同时测定钛白粉中6种元素成分的方法。研究中,实验深入探讨压片制样中制样压力和时间对元素含量检测结果的影响,并据此确认样品制备条件。同时,实验针对基体效应及谱线重叠干扰校正等问题进行研究,通过软件提供的多元线性回归分析模型,以经验法建立各元素分析的校准曲线,并基于3倍背景信号波动的标准偏差计算出各元素的检出限(3 s)。为了进一步验证方法的精密度,实验不同钛白粉样品进行测试,测定值的相对标准偏差(n=10)为0.4%~5.9%。实验结果表明,钛白粉X射线荧光光谱测定的关键条件方法,包括检出限、准确度及重复性等,均能满足日常分析检测的要求,对实验室的钛白粉检测工作具有重要的指导意义。This study adopts the press-plate sample making-X-ray fluorescence spectroscopy determination technology,using 9 kinds of prepared titanium dioxide as the calibration sample,and establishes a method that can determine the 6 elements of titanium dioxide at the same time.In the study,we explored the influence of sample preparation pressure and time on the element content detection results in the compression sample preparation,and optimized the sample preparation conditions accordingly.At the same time,we studied the problems of matrix effect and line overlap interference correction.Through the multiple linear regression analysis model provided by the software,the calibration curve of each element analysis was established by empirical method,and calculated the detection limit(3 s)of each element based on the standard deviation of 3 times background signal fluctuation.To further verify the precision of the method,we tested different titanium dioxide samples,and the relative standard deviation of the measured value(n=10)was 0.4%~5.9%.The experimental results show that the key conditions and methods of X-ray fluorescence spectroscopy of titanium dioxide,including detection limit,accuracy and repeatability,can meet the requirements of daily analysis and detection,which has important guiding significance for the laboratory of titanium dioxide detection.

关 键 词：粉末压片制样 X射线荧光光谱法(XRF) 钛白粉 元素含量 

分 类 号：TQ630.72[化学工程—精细化工]