In-situ temperature-controllable grazing incidence X-ray scattering of semiconducting polymer thin films under stretching  

可控温原位拉伸条件下聚合物半导体薄膜的掠入射X射线散射

作　　者：Yu Chen Saimeng Li Zhibang Shen Chunlong Sun Jintao Feng Long Ye 陈雨;李赛萌;沈治邦;孙纯龙;冯锦涛;叶龙

机构地区：[1]Beijing Synchrotron Radiation Laboratory,Institute of High Energy Physics,Chinese Academy of Sciences,Beijing 100049,China [2]School of Materials Science and Engineering,Tianjin Key Laboratory of Molecular Optoelectronic Science,Tianjin University,Key Laboratory Organic Integrated Circuits,Ministry of Education,and Collaborative innovation Center of Chemical Science and Engineering(Tianjin),Tianjin 300072,China

出　　处：《Science China Materials》2024年第12期3917-3924,共8页中国科学（材料科学）（英文版）

基　　金：the support from the Science Fund for Distinguished Young Scholars of Tianjin (23JCJQJC00240);the Fundamental Research Funds for the Central Universities;the Collaborative Innovation Center of Chemical Science and Engineering (Tianjin);Peiyang Scholar Program of Tianjin University;supported by the National Natural Science Foundation of China (12375302)。

摘　　要：The advancement in grazing incidence X-ray scattering(GIWAXS)techniques at synchrotron radiation facilities has significantly deepened our understanding of semiconducting polymers.However,investigation of ultrathin polymer films under tensile conditions poses challenge,primarily due to limitations associated with the lack of suitable sample preparation methods and new stretching devices.This study addresses these limitations by designing and developing an in-situ temperature-controllable stretching sample stage,which enables real-time structural measurements of ultrathin polymer films at Beijing Synchrotron Radiation Facility.In particular,we report,for the first time,in-situ GIWAXS results of representative semiconducting polymer thin films under variable-temperature stretching.This research has overcome the limitations imposed by sample constraints,thus facilitating the achievement of valuable insights into the behavior of ultrathin polymer films under tensile conditions.Distinct changes in the molecular ordering and packing within the polymer thin films as a result of increasing applied strain and temperature have been uncovered.This study promotes future developments in the field,thus enabling the design and optimization of intrinsically stretchable electronic devices and other technologically relevant applications.近年来,随着同步辐射掠入射X射线散射(GIWAXS)技术的广泛应用,研究人员对聚合物半导体的理解取得了显著进展.然而,在拉伸条件下利用GIWAXS研究聚合物超薄膜仍面临诸多挑战,主要瓶颈在于新型原位实验装置的开发和数据解析方法的建立.为应对这一难题,本研究设计并开发了一种可控温、可旋转的原位拉伸样品台装置,能够在北京同步辐射装置和上海光源实现对聚合物超薄膜的动态结构表征.以代表性半导体聚合物为例,首次展示了变温拉伸条件下的原位GIWAXS实验结果.研究发现,随着应变和温度的增加,聚合物薄膜的分子排列和堆积发生了显著变化.该研究深化了对聚合物超薄膜在拉伸条件下行为的理解,有望推动可拉伸电子器件及薄膜结构表征方法的设计与优化.

关 键 词：semiconducting polymers ultrathin films grazing incidence X-ray scattering stretching device strain-induced microstructural evolution 

分 类 号：TN304.055[电子电信—物理电子学]