基于Geant4的X射线背散射成像仿真研究  

Simulation study of X-ray backscattering imaging based on Geant4

作　　者：蒋璧有 郭丽娜 赵耀霞[1] 陈平[1] JIANG Biyou;GUO Lina;ZHAO Yaoxia;CHEN Ping(State Key Laboratory of Dynamic Testing Technology,North University of China,Taiyuan 030051,China)

机构地区：[1]中北大学动态测试技术国家重点实验室,山西太原030051

出　　处：《中国测试》2024年第11期17-24,32,共9页China Measurement & Test

基　　金：国家自然科学基金资助项目(62103384,62201520,62301508,62301507,U23A20285);国家重点研发计划资助项目(2023YFE0205800);山西省自然科学基金资助项目(202103021224190,202303021222096,202203021222052,202303021212207);山西省重点研发计划资助项目(202302150401011);中央引导地方科技发展资金项目(YDZJSX2024D037)。

摘　　要：为有效地探测到隐藏在高原子序数物质背后的低原子序数物质,文章采用X射线背散射成像技术进行实验,通过蒙特卡罗仿真软件Geant4简化飞点扫描X射线背散射成像系统,对隐藏在铁板后的碳块探测并成像,最后为能够高效地探测较大的目标区域,文章提出一种针对大区域探测的优化算法。实验结果表明,仿真的背散射成像系统能够探测到铁板后的碳块,最终图像的质量与可控因素(X射线能量强度、探测器尺寸)和不可控因素(遮挡物厚度、被测物深度)密切相关,提出的优化算法能够在扫描探测的同时成像,缩短成像时间且能及时发现待测物体。因此,X射线背散射成像技术具有一定的潜力,解决探测隐藏在高原子序数物质背后的低原子序数物质难以探测的问题。In order to effectively detect the low atomic number material hidden behind the high atomic number material,this paper adopts the X-ray backscattering imaging technology to conduct experiments.Monte Carlo simulation software Geant4 simplifies the flying spot scanning X-ray backscattering imaging system to detect and image the carbon block hidden behind the iron plate.Finally,in order to efficiently detect a large target area.This paper presents an optimization algorithm for large area detection.The experimental results show that the simulated backscattering imaging system can detect the carbon block behind the iron plate,and the quality of the final image is closely related to controllable factors(X-ray energy intensity,detector size)and uncontrollable factors(Barrier thickness and depth of the measured object).The proposed optimization algorithm can image while scanning detection,shorten the imaging time and timely discover the object to be measured.Therefore,X-ray backscattering imaging technology has a certain potential to solve the problem that it is difficult to detect the low atomic number material hidden behind the high atomic number material.

关 键 词：X射线背散射成像 Geant4仿真 飞点扫描 蒙特卡罗 成像算法 

分 类 号：TB9[一般工业技术—计量学]