Characterization of single-pulse photon energy and photon energy jitter at the Shanghai soft X-ray Free-Electron Laser  

作　　者：Zichen Gao Yajun Tong Yueran Wang Xinyuan Wang Pingping Wen Donghao Lu Xinye Yuan Difei Zhang Jingcheng Xiao Xiaokai Li Zhihao Guan Jiacheng Gu Yonggan Nie Zhi Guo Zhen Wang Chao Feng Jiadong Fan Huaidong Jiang 高梓宸;佟亚军;王悦然;王新元;温平平;卢栋浩;袁心也;张迪菲;肖靖铖;李晓凯;关治豪;顾嘉成;聂勇敢;郭智;王震;冯超;范家东;江怀东(School of Physical Science and Technology,ShanghaiTech University,Shanghai 201210,China;Center for Transformative Science,ShanghaiTech University,Shanghai 201210,China;Shanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai 201210,China)

机构地区：[1]School of Physical Science and Technology,ShanghaiTech University,Shanghai 201210,China [2]Center for Transformative Science,ShanghaiTech University,Shanghai 201210,China [3]Shanghai Advanced Research Institute,Chinese Academy of Sciences,Shanghai 201210,China

出　　处：《Chinese Optics Letters》2024年第10期106-111,共6页中国光学快报（英文版）

基　　金：supported by the Major State Basic Research Development Program of China(No.2022YFA1603703);the National Natural Science Foundation of China(No.12335020);the Strategic Priority Research Program of the Chinese Academy of Sciences(No.XDB37040303);supported by the Shanghai Soft X-ray Free-Electron Laser Beamline Project。

摘　　要：The X-ray free-electron laser(XFEL),a new X-ray light source,presents numerous opportunities for scientific research.Self-amplified spontaneous emission(SASE)is one generation mode of XFEL in which each pulse is unique.In this paper,we propose a pinhole diffraction method to accurately determine the XFEL photon energy,pulses'photon energy jitter,and sample-to-detector distance for soft X-ray.This method was verified at Shanghai soft X-ray Free-Electron Laser(SXFEL).The measured average photon energy was 406.5 eV,with a photon energy jitter(root-mean-square)of 1.39 eV,and the sample-to-detector distance was calculated to be 16.61 cm.

关 键 词：X-ray free-electron laser self-amplified spontaneous emission photon energy characterization photon energy jitter XFEL single-pulse diffraction 

分 类 号：TN248[电子电信—物理电子学]