一种Flash故障检测算法的设计与验证  

Design and validation of a FLASH memory fault detection algorithm

作　　者：唐俊龙[1] 杨晟熙 邹望辉 陈俊杰 龚源浩 TANG Junlong;YANG Shengxi;ZOU Wanghui;CHEN Junjie;GONG Yuanhao(School of Physical&Electronic Science,Changsha University of Science and Technology,Changsha 410114,China;Guangdong Synwit integrated circuit Co.,Ltd.,Changsha 410205,China)

机构地区：[1]长沙理工大学物理与电子科学学院,湖南长沙410114 [2]广东华芯微特集成电路有限公司,湖南长沙410205

出　　处：《微电子学与计算机》2024年第12期100-110,共11页Microelectronics & Computer

基　　金：柔性电子材料基因工程湖南省重点实验室开放基金(202015)。

摘　　要：随着芯片制造工艺与逻辑复杂度的提升,对非易失性存储部件的要求越来越高。Flash存储部件由于高稳定性和性价比被广泛使用,且以IP形式集成到芯片内部,导致芯片原型样品测试时间成本和资源成本增加。为降低芯片样品测试时间和提高检测Flash的故障覆盖率,提出了一种新的Flash故障算法,通过对Flash存储器不同故障相同部分的敏化序列进行提取,提取内容替换部分March-like算法内容,再加入少量读写操作,达到符合所有故障敏化序列的要求,减少了算法步骤,使Flash存储单元通过自动测试设备(ATE)检测时,提高测试效率和所能探测的故障种类。实验结果表明,该算法在存储器规格一致的情况下,比较于March-like pFlash和March-like算法,测试效率分别提高39%与52%,故障覆盖种类分别增加2到3种。With the advancement of chip manufacturing processes and increasing logic complexity,the demand for nonvolatile storage components has risen.Flash storage components are widely used due to their high stability and costeffectiveness,and are integrated into chips as intellectual property(IP),which leads to increased time and resource costs for testing chip prototype samples.In order to reduce the testing time of chip samples and improve the fault coverage of Flash faults,a novel Flash fault algorithm is proposed.The algorithm extracts sensitization sequences for different faults in the same part of the Flash memory,replaces part of the content of the March-like algorithm,and adds a small number of read and write operations to meet the requirements of all fault sensitization sequences.This reduces the algorithm steps,allowing Flash storage units to achieve higher testing efficiency and detectable fault types through Automatic Test Equipment(ATE).Experimental results demonstrate that,under consistent memory specifications,the proposed algorithm improves testing efficiency by 28%and 52%compared to March-like pFlash and March-like algorithms,respectively.The fault coverage types are increased by 2 to 3 respectively.

关 键 词：Flash故障检测 March-like算法 Flash故障敏化序列 ATE检测 

分 类 号：TN707[电子电信—电路与系统]