便携式计算机热插拔引起的低压浪涌试验要求  

Requirements for Low Voltage Surge Test due to Hot Swap of Portable Computers

作　　者：王壮 董智芝 阮武 于龙 WANG Zhuang;DONG Zhizhi;RUAN Wu;YU Long(Lenovo(Beijing)Co.,Ltd.,Beijing 100085,China;Hefei LCFC Information Technology Co.,Ltd.,Hefei 230601,China)

机构地区：[1]联想(北京)有限公司,北京100085 [2]合肥联宝信息技术有限公司,安徽合肥230601

出　　处：《电子质量》2024年第11期95-99,共5页Electronics Quality

摘　　要：热插拔技术为用户带来了显著的便捷性,简化了操作流程。然而,热插拔过程中产生的充电端口低压浪涌现象可能构成重大隐患,有可能导致设备损坏,进而给用户带来财产损失。为了评估此类风险并减少由热插拔引发的低压浪涌所带来的潜在危害,提出了一套针对便携式计算机输入/输出端口在热插拔条件下低压浪涌抗扰度的测试要求及分级标准。同时,详细阐述了相应的测试方法、测试流程及测试结果的评价体系,旨在为同类测试提供参考。Hot swap technology brings significant convenience to users by simplifying operational procedures.However,the low-voltage surge phenomenon occurring at the charging port during hot swap poses a significant potential risk,which may lead to equipment damage and subsequently cause property losses for users.To assess such risks and mitigate the potential hazards associated with low-voltage surges induced by hot swap,a set of test requirements and classification standards for the low-voltage surge immunity of input/output ports on portable computers under hot swap conditions are proposed.Additionally,the corresponding test methods,test procedures,and evaluation system for test results are elaborated in detail so as to provide a reference for similar tests.

关 键 词：热插拔 输入/输出端口 低压浪涌试验 

分 类 号：TP32[自动化与计算机技术—计算机系统结构] TB114.37[自动化与计算机技术—计算机科学与技术]