去嵌入技术在高速背板连接器测试中的应用  

The Application of De-embedding Technology in High-speed Backplane Connector Testing

作　　者：蔡泓州 吴泽武 杜天尧 CAI Hongzhou;WU Zewu;DU Tianyao(CEPREI,Guangzhou 511370,China)

机构地区：[1]工业和信息化部电子第五研究所,广东广州511370

出　　处：《电子质量》2024年第11期100-105,共6页Electronics Quality

摘　　要：随着通信技术的日益发展,人们对于数据传输速率的要求也越来越高。背板连接器作为数据传输链路的枢纽和桥梁,广泛地运用于通信技术中。背板连接器承载的数据具有速率高、吞吐量大的特点,其阻抗、传播延迟、时滞和串扰等参数都会影响数据传输的质量。但是,高速背板连接器高速性能的测试结果经常会引入夹具载板参数而与真值有较大的偏差。因此,对背板连接器测试技术的研究显得尤为重要。设计了一种适用于高速背板连接器的去嵌方法,介绍了其去嵌入原理和过程。其原理的核心为时域选通和信号流图,通过简单的推算演示去嵌入的过程。在此理论基础上,通过优化夹具和测试细节,以使测试结果更接近真值。With the increasing development of communication technology,people have higher and higher requirements for data transmission rate.As the hub and bridge of the data transmission link,the backplane connector is widely used in communication technology.The data carried by the backplane connector has the characteristics of high speed and high throughput,and its parameters such as impedance,propagation delay,time delay and crosstalk will affect the quality of data transmission.However,the test results of the high-speed performance of the highspeed backplane connector often introduce the parameters of the fixture carrier board and have a large deviation from the true value.Therefore,the research on the backplane connector testing technology is particularly important.A deembedding method suitable for high-speed backplane connectors is designed,and its de-embedding principle and process are introduced.The core of its principle is time domain gating and signal flow graph,which demonstrates the process of de-embedding through simple calculation.Based on this theoretical basis,the test results are closer to the true value by optimizing the fixture and test details.

关 键 词：时域选通 信号流图 去嵌 高速背板连接器 测试 

分 类 号：TN919.3[电子电信—通信与信息系统]