浅谈电容器用金属化膜若干检测问题  

Discussion on Detection of Metallized Films for Capacitor

作　　者：张柳燕 葛新明 王芳[1,2] 耿兰芳 郑军[1,2] 杨英[1] ZHANG Liuyan;GE Xinming;WANG Fang;GENG Lanfang;ZHENG Jun;YANG Ying(Anhui University of Technology,Key Laboratory of Green Fabrication and Surface Technology of Advanced Metal Materials,Anhui Ma’anshan 243002,China;Anhui University of Technology,School of Materials Science and Engineering,Anhui Ma’anshan 243002,China)

机构地区：[1]安徽工业大学先进金属材料绿色制备与表面技术教育部重点实验室,安徽马鞍山243002 [2]安徽工业大学材料科学与工程学院,安徽马鞍山243002

出　　处：《电力电容器与无功补偿》2024年第6期17-24,共8页Power Capacitor & Reactive Power Compensation

基　　金：安徽省科技重大专项(2021e03020002)。

摘　　要：薄膜电容器作为基础电力电子元器件广泛应用于能源、军事、医疗等领域。相比于箔式薄膜电容器,金属化膜电容器具有体积小、损耗低、可靠性高等优异特性。针对目前业内电容器用金属化薄膜在厚度测量、微观结构观察和应力检测等方面存在的一定困难。本文概述了电容器用金属化薄膜在上述方面的研究进展和存在的具体问题,并给出了相应建议,为金属化膜电容器的发展提供理论指导。Film capacitor,as a basic electronic component,is widely used in fields such as energy,military and medical treatment.The metallized film capacitor,compared to foil film capacitor,exhibits excellent features such as small size,low loss and high reliability.However,there are currently some difficulties in thickness measurement,microstructure observation and stress detection for metallized films used in capacitors.In this paper,the research progress and existed specific problems of the metallized films for capacitors in above aspects are summarized and corresponding suggestions are proposed in order to provide theoretical guidance for the development of metallized film capacitors.

关 键 词：薄膜电容器 金属化薄膜 膜厚测量 微观结构 应力检测 

分 类 号：TM53[电气工程—电器]