电热应力联合作用下的薄膜电容器寿命预测  

Life Prediction of Film Capacitor Under Combined Action of Electrothermal Stress

作　　者：贾磊 姚成 刘刚[1,2] JIA Lei;YAO Cheng;LIU Gang(Electric Power Research Institute,CSG,Guangzhou 510663,China;National Engineering Research Center of UHV Technology and Novel Electrical Equipment Basis,Kunming 651705,China)

机构地区：[1]南方电网科学研究院有限责任公司单位,广州510663 [2]特高压电力技术与新型电工装备基础国家工程研究中心,昆明651705

出　　处：《电力电容器与无功补偿》2024年第6期25-29,共5页Power Capacitor & Reactive Power Compensation

基　　金：特高压电力技术与新型电工装备基础国家工程研究中心开放基金项目(NERCUHV2022KF03)。

摘　　要：薄膜电容器是电力电子系统的关键部件,其可靠性关乎设备运行的稳定,而电压和温度是影响电容器老化的关键因素。本文以聚丙烯薄膜电容器为对象,建立了电热应力加速老化试验平台,并提取了不同温度和电压条件下薄膜电容器的寿命,结合Arrhenius模型和指数模型对薄膜电容器进行寿命预测研究。研究结果表明,当温度和电压升高时,电容器寿命显著减小,其中电压对薄膜电容器老化的影响比温度更显著。该研究有助于进一步分析电热应力对薄膜电容器老化的作用机制,可用于寿命预测以提高系统的可靠性。Film capacitor is the key component of power electronic system and its reliability is highly related to the stable operation of the power equipment.However,voltage and temperature are the critical factors affecting aging of the capacitor.In this paper,the polypropylene film capacitor is taken as the object.The electrothermal stress accelerated aging test platform is set up,the life of the film capacitor is extracted under different temperatures and voltages and the Arrhenius model and exponential model are combined to study the life prediction of the film capacitor.The study results show that with the increase of temperature and voltage the life of the capacitor is reduced significantly,in which the influence of voltage on the aging of the film capacitor is more significant than that of the temperature.This study helps to further analyze the mechanism of electrothermal stress on the aging of thin film capacitor and can be used for life prediction to improve reliability of the system.

关 键 词：薄膜电容器 加速老化 电压 温度 

分 类 号：TM53[电气工程—电器]