Modelling and Optimizing Motherboard Functional Testing in Laptop Manufacturing  

作　　者：BAI Peng KANG Yu WANG Kangcheng ZHAO Yunbo DONG Shaojie 

机构地区：[1]Department of Automation,University of Science and Technology of China,Hefei 230026,China [2]Department of Automation&Institute of Advanced Technology,University of Science and Technology of China,Hefei 230026,China [3]Institute of Artificial Intelligence,Hefei Comprehensive National Science Center,Hefei 230088,China [4]Institute of Advanced Technology,University of Science and Technology of China,Hefei 230026,China

出　　处：《Journal of Systems Science & Complexity》2024年第6期2406-2423,共18页系统科学与复杂性学报（英文版）

基　　金：supported by the Key Research and Development Program of Anhui under Grant No.202104a05020064。

摘　　要：Functional testing is key to fulfill quality control in laptop manufacturing and is of great economic value.However,due to the unavailability of practical data,mathematical model and systematic perspective,it has barely been touched from the academic community to date.For the first time,this work provides technical understanding of the key principles of functional testing,mathematically models the general framework,elucidates existing testing strategy under the proposed framework and model,and finally proposes a specified optimization strategy which outperforms existing strategies.This work lays the model foundation for the further optimization of functional testing,and can be regarded as a good example of how a systematic approach can solve practical industrial challenges.

关 键 词：Laptop manufacturing MODELLING motherboard functional testing OPTIMIZATION 

分 类 号：TP368.32[自动化与计算机技术—计算机系统结构]