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作 者:汤振阳 TANG Zhenyang(Shanghai Electric Wind Power Group Co.,Ltd.,Shanghai 200233,China)
机构地区:[1]上海电气风电集团股份有限公司,上海200233
出 处:《上海大中型电机》2024年第4期37-40,共4页Shanghai Medium and Large Electrical Machines
摘 要:本文探讨了等温松弛电流法测量主绝缘缺陷的机理,对不同老化周期的主绝缘试样进行了极化并测量极化电流,通过计算机拟合,可量化评估不同老化周期后的界面极化陷阱深度(τ_(1))、界面极化陷阱密度(a_(1))、缺陷极化陷阱深度(τ_(2))、缺陷极化陷阱密度(a_(2))的变化。试验结果表明,该绝缘结构老化过程中,界面极化陷阱深度τ_(1)基本平稳,缺陷极化陷阱深度τ_(2)整体数量趋势降低,界面极化陷阱密度a_(1)和缺陷极化陷阱密度a_(2)持续升高。In this paper,the mechanism of measuring main insulation defects by isothermal relaxation current method is discussed,the main insulation samples in different aging periods are polarized and the polarization current measured.By computer fitting,the changes of the depth of interfacial polarization trap(τ_(1)),the density of interfacial polarization trap(a_(1)),the depth of defect polarization trap(τ_(2))and the density of defect polarization trap(a_(2))after different aging periods can be quantified;with experimental results showing that during the aging process of the insulation structure,the depthτ_(1)of interfacial polarization trap is basically stable,the overall number of the depthτ_(2)of defect polarization trap decreases,and interface polarization number a_(1)and defect polarization number a_(2)continue to increase.
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