基于ATE的FPGA自动重配置系统设计  

An Automatic Reconfiguration System for FPGA Based on ATE

作　　者：廖勇 谢栋材 白洋 韦纯进 张亭亭 何莹莹 LIAO Yong;XIE Dongcai;BAI Yang;WEI Chunjin;ZHANG Tingting;HE Yingying(China Aerospace Science&Industry Corp Defense Technology R&T Center,Beijing 100854,China)

机构地区：[1]航天科工防御技术研究试验中心,北京100854

出　　处：《计算机测量与控制》2024年第12期263-269,共7页Computer Measurement &Control

基　　金：航天科工防御技术研究试验中心创新基金课题(220007243NN0306)。

摘　　要：针对FPGA内各逻辑资源和电性能参数的自动批量配置测试问题,提出了一种将自动重配置模块、ATE测试平台和上位机软件相结合的应用程序自动重配置系统方案;通过上位机软件在自动重配置模块中完成待测FPGA的应用程序加载,实现软硬件结合;基于XC7A100T型FPGA搭建自动重配置系统,运用三段式状态式实现应用程序自动下载;实验结果表明,该系统可实现待测FPGA在多种配置模式下应用程序自动下载,完成待测FPGA芯片的逻辑资源和电性能参数自动批量测试;对于XC6SLX16-2CSG324-T型FPGA,从并模式下自动配置测试时间仅需7 min,极大节省了应用程序配置时间,满足各类FPGA自动批量测试需求。Aiming at the problem of automatic batch configuration test of logic resources and electrical performance parameters in FPGA,an application program automatic reconfiguration system scheme is proposed,which combines automatic reconfiguration module,ATE test platform and host software.The application program of FPGA to be tested is loaded in the automatic reconfiguration module by the upper computer software to realize the combination of software and hardware.The automatic reconfiguration system is built based on XC7A100T FPGA,and the application program is automatically downloaded by three-stage state machine.The experimental results show that the system can automatically download the application program of the FPGA under various configuration modes,and complete the automatic batch testing of the logic resources and electrical performance parameters of the FPGA chip under test.For XC6SLX16-2CSG324-T FPGA,the automatic configuration test time only needs 7 min in parallel mode,which greatly saves the application configuration time and meets the requirements of automatic batch testing of various FPGA automatic batch tests.

关 键 词：FPGA测试 自动重配置系统 质量可靠性 自动批量测试 

分 类 号：TP391[自动化与计算机技术—计算机应用技术]