Tolerance analysis of non-depolarizing double-pass polarimetry  

作　　者：Yimin Yu Nabila Baba-Ali Gregg M.Gallatin 

机构地区：[1]Shanghai Micro Electronics Equipment(Group)Co.,Ltd.,1525 Zhangdong Road,201203 Shanghai,China.2Stamford,Connecticut,USA.

出　　处：《PhotoniX》2020年第1期75-94,共20页智汇光学（英文）

摘　　要：Double-pass polarimetry measures the polarization properties of a sample over a rangeof polar angles and all azimuths. Here, we present a tolerance analysis of all the opticalelements in both the calibration and measurement procedures to predict thesensitivities of the double-pass polarimeter. The calibration procedure is described by aMueller matrix based on the eigenvalue calibration method (ECM) [1]. Our numericalresults from the calibration and measurement in the Mueller matrix description withtolerances limited by systematic and stochastic noise from specifications ofcommercially available hardware components are in good agreement with previousexperimental observations. Furthermore, by using the orientation Zernike polynomials(OZP) which are an extension of the Jones matrix formalism, similar to the Zernikepolynomials wavefront expansion, the pupil distribution of the polarization propertiesof non-depolarizing samples under test are expanded. Using polar angles ranging upto 25°, we predict a sensitivity of 0.5% for diattenuation and 0.3° for retardance usingthe root mean square (RMS) of the corresponding OZP coefficients as a measure of theerror. This numerical tool provides an approach for further improving the sensitivities ofpolarimeters via error budgeting and replacing sensitive components with thosehaving better precision.

关 键 词：Tolerance analysis POLARIMETRY Jones matrix Mueller matrix 

分 类 号：O17[理学—数学]