超薄电子玻璃的抛光缺陷及解决方案  

Defects and Solutions in the Polishing Process of Ultra-thin Electronic Glass

作　　者：巩瑞龙 王长军 孙飞虎 王会勇 韩正伟 冯正君 GONG Ruilong;WANG Changjun;SUN Feihu;WANG Huiyong;HAN Zhengwei;FENG Zhengjun(Hebei Panel Glass Co.,Ltd.,Hebei Province Company Technology Center,Hebei Province Ultra-thin Electronic Glass Technology Innovation Center,Hebei Engineering Research Center of Ultra-thin Silicate Glass,Langfang 065000,China)

机构地区：[1]河北视窗玻璃有限公司,河北省企业技术中心,河北省超薄电子玻璃技术创新中心,超薄硅酸盐玻璃河北省工程研究中心,廊坊065000

出　　处：《玻璃搪瓷与眼镜》2024年第12期42-45,共4页Glass Enamel & Ophthalmic Optics

基　　金：河北省中央引导地方发展资金(236Z1105G)。

摘　　要：超薄电子玻璃抛光过程中可能出现各类缺陷,如表面划痕、磨削过度、磨削不足、麻点等,研究分析了缺陷产生的原因,提出改进措施,并展望了未来的研究方向。Various defects such as surface scratches,over-grinding,under-grinding,pits and others that may occur during the polishing process of ultra-thin electronic glass were investigated and analyzed.The causes of these defects were examined,and improvement measures were proposed.Additionally,future research directions in this area were discussed and anticipated.

关 键 词：超薄电子玻璃 抛光 表面缺陷 解决措施 

分 类 号：TQ171.65[化学工程—玻璃工业]