电子材料及其元器件的温频特性测试箱  

Equipment for Testing Temperature and Frequency Characteristic of Elecrtronic Materials and Component & Device

作　　者：陈云[1] 袁战恒[1] 姚熹[1] 

机构地区：[1]西安交通大学电信学院电子工程系,陕西西安710049

出　　处：《电子元器件应用》2002年第11期41-45,共5页Electronic Component & Device Applications

摘　　要：介绍一种电子材料及元器件的片式样品温频特性测量用的测试箱。该测试箱不仅能够实现-150℃～+250℃的线性变温或定点恒温测试,而且可以消除仪器到试样的引线传递误差和干扰误差,在给定测试范围内实现稳定、可靠的测试。The testing equipment for measuring temperature/frequency characteristics of electronic materials and component/ devices is presented. The equipment not only performes test of linear raising temperature or stable temperature points in the range from - 150℃ to+ 250℃, but also eliminates the tolerance of the line between fixtures and beginning point of meter or the tolerance of disturbing between lines. The measuring of characteristics is realized stablely and reliablely in the range of indicating conditions.

关 键 词：电子材料 片式元件 温频特性 传输线残量 

分 类 号：TM935[电气工程—电力电子与电力传动]