高加速寿命试验(HALT)与高加速应力筛选(HASS)  

Highly Accelerated Life Test(HALT)And Highly Accelerated Stress Screen(HASS)

作　　者：褚卫华[1] 陈循[1] 陶俊勇[1] 张春华 蒋培[1] 

机构地区：[1]国防科技大学机电工程与自动化学院,长沙410073

出　　处：《强度与环境》2002年第4期23-37,共15页Structure & Environment Engineering

摘　　要：本文简要介绍了HALT/HASS试验技术的产生、发展及在国外的应用情况 ,在深入分析HALT/HASS试验技术基本原理和环境应力与诱发的故障模式之间关系的基础上 ,阐述了HALT/HASS试验技术的核心———试验剖面图的建立方法 ,并对HALT/HASS试验技术的特点。In this paper,the producing,development and application of the HALT/HASS technique are briefly introduced.Based on the deeply analyzing the fundamental principle of the HALT/HASS technique and the relations between the applied environmental stresses and the failure modes excited by these stresses,the method that is used to design the HALT/HASS profile is described.Moreover,the HALT/HASS characteristics are particularly explained,and the needing resource in HALT/HASS and other matters are presented in detail.

关 键 词：高加速寿命试验 高加速应力筛选 环境应力筛选 可靠性 电力设备 

分 类 号：TN06[电子电信—物理电子学]