我国深空探测器综合测试技术发展  

Development of Electrical Test Technology for China’s Deep Space Probes

作　　者：王劲榕[1] 傅晓晶[1] 何晓宇[1] 富小薇[1] 宋世民[1] 权爽[1] 尹溶森 刘一鸣 田国亮 赵阳[1] WANG Jinrong;FU Xiaojing;HE Xiaoyu;FU Xiaowei;SONG Shimin;QUAN Shuang;YIN Rongsen;LIU Yiming;TIAN Guoliang;ZHAO Yang(Beijing Institute of Spacecraft System Engineering,Beijing 100094,China)

机构地区：[1]北京空间飞行器总体设计部,北京100094

出　　处：《航天器工程》2024年第6期159-167,共9页Spacecraft Engineering

摘　　要：综合测试作为探测器系统设计验证的重要环节,其技术发展有力支持和保障了探测器的产品质量及研制进度。文章分析了我国深空探测器综合测试任务的需求特点,梳理论述了我国在月球探测和行星探测任务中综合测试技术发展应用情况,系统地总结了我国在深空探测器测试设计、测试系统以及测试过程控制与评估等技术方面的进步。最后,展望月球与深空探测领域综合测试的发展需求,提出综合测试技术后续的重点发展方向。As an important part in the development and production process of probes,electrical test technology has provided strong supports and assurance for the product quality and development progress of the probes.This paper analyzes the requirementsand characteristics of electrical test tasks for China's deep space probes,summarizes the developments and applications of electrical test technology in the China's lunar exploration and planetary exploration missions,and systematically summarizes the technological progress made in test design,test tools,test implement and evaluation.Finally,looking forward to the development demands of the lunar and deep-space explorations,the follow-up key technical development directions for electrical test technology are proposed.

关 键 词：深空探测器 综合测试技术 技术发展 

分 类 号：V416[航空宇航科学与技术—航空宇航推进理论与工程]