太阳电池阵基板在热真空试验中微弱热变形测量试验研究  

作　　者：卞永刚 

机构地区：[1]上海格思信息技术有限公司,上海201203

出　　处：《科技创新与应用》2025年第1期62-65,共4页Technology Innovation and Application

摘　　要：该文主要内容研究的是在真空冷黑环境下,通过空间外热流模拟的方式结合数字化摄影测量的手段对太阳电池阵基板的微弱变形量进行测试试验研究。试验方案中采用非接触式红外灯阵模拟空间外热流的方式,同时使用空间环境模拟设备建立试验所需的真空冷黑环境,对太阳电池阵基板进行热流的施加,试验过程中采用数字化摄影测量对不同外热流作用下造成的太阳电池阵基板的微弱热变形进行测量。试验结果表明,在红外灯阵辐射热流的作用下,太阳电池阵基板2 m×1.44 m范围内的热变形测量精度优于0.05 mm,该指标可以满足测量精度要求,光学摄影测量方法可作为测量太阳电池阵基板在热真空试验过程中微弱变形的测量方法,并且试验验证该方法有效,解决热真空试验过程中太阳电池阵基板热变形测量的问题,为后续电池阵表面设计盖片及盖片之间银连片设计提供试验数据支撑。The main content of this paper is to test and study the weak deformation of solar cell array substrates through external heat flow simulation combined with digital photogrammetry in a vacuum cold black environment.In the test plan,a non-contact infrared lamp array was used to simulate external heat flow in space.At the same time,space environment simulation equipment was used to establish the vacuum cold black environment required for the test,and heat flow was applied to the solar cell array substrate.During the test,digital photogrammetry measures the weak thermal deformation of the solar cell array substrate caused by different external heat flows.The test results show that under the action of the radiant heat flow of the infrared lamp array,the measurement accuracy of thermal deformation of the solar cell array substrate within the range of 2 m×1.44 m is better than 0.05 mm,which can meet the measurement accuracy requirements.The optical photogrammetry method can be used as a measurement method to measure the weak deformation of the solar cell array substrate during the thermal vacuum test.The test has verified that the method is effective,solving the problem of measuring the thermal deformation of the solar cell array substrate during the thermal vacuum test.It provides experimental data support for subsequent battery array surface design of the cover sheet and the design of silver connecting strips between the cover sheets.

关 键 词：热真空试验 太阳电池阵基板 数字化摄影测量 微弱热变形测量 外热流模拟 红外灯阵设计 

分 类 号：V442[航空宇航科学与技术—飞行器设计]