Application of SEM-CL system in the characterization of material microstructures  

作　　者：Rongrong Jiang Yirong Yao Jianmin Guan Jiafeng Shen Huanming Lu Ming Li 

机构地区：[1]Test Center,Ningbo Institute of Materials Technology and Engineering,Chinese Academy of Sciences,Ningbo 315201,China

出　　处：《Frontiers of Materials Science》2024年第4期1-19,共19页材料学前沿(英文版)

基　　金：supports by the Zhejiang Provincial Natural Science Foundation(Grant No.TGC24E020003).

摘　　要：Cathodoluminescence(CL)characterization technology refers to a technical approach for evaluating the luminescent properties of samples by collecting photon signals generated under electron beam excitation.By detecting the intensity and wavelength of the emitted light,the energy band structure and forbidden bandwidth of a sample can be identified.After a CL spectrometer is mounted on a scanning electron microscope(SEM),functions are integrated,such as high spatial resolution,morphological observation,and energy-dispersive spectroscopy(EDs)to analyze samples,offering unique and irreplaceable advantages for the microstructural analysis of certain materials.This paper reviews the applications of SEM-CL systems in the characterization of material microstructures in recent years,illustrating the utility of the SEM-CL system in various materials including geological minerals,perovskite materials,semiconductor materials,non-metallic inclusions,and functional ceramics through typical casestudies.

关 键 词：scanning electron microscope CATHODOLUMINESCENCE ggeological mineral perovskite material semiconductor material non-metallic inclusion functional ceramic 

分 类 号：TB301[一般工业技术—材料科学与工程]