安全芯片多模块随机组合验证方法的设计与实现  

Design and Implementation of Multi-module Random Combination Verification Method for Security Chips

作　　者：董攀 王延斌 陈汶永 DONG Pan;WANG Yan-bin;CHEN Wen-yong(Beijing Key Laboratory of RFID Chip Test Technology,CEC Huada Electronic Design Co.,Ltd.)

机构地区：[1]北京中电华大电子设计有限责任公司射频识别芯片检测技术北京市重点实验室

出　　处：《化工自动化及仪表》2025年第1期131-137,共7页Control and Instruments in Chemical Industry

基　　金：国家重点研发计划"十四五"重点专项(纳微电子技术)(批准号:2022YFB4400404)资助的课题。

摘　　要：安全芯片的功能隐患可能造成重大事故。安全芯片的内部功能模块很多,运行过程中是多个模块并行随机工作,采用顺序执行方式很难发现芯片的潜在问题。因此,提出一种多模块随机组合验证方法,在多款芯片上的验证结果表明:所提方法能够高效率、高概率地发现芯片的多模块组合问题,提高了发现和解决安全芯片问题的效率。Considering the fact that the hidden trouble in the security chip may cause some accidents.the security chip has many internal function modules which works randomly in parallel during the operation and it’s difficult for sequential execution to find out chip’s potential problems.In this paper,a multi-module random combination verification method was proposed and verified on multiple chips to show that,the proposed method can find out multi-module combination problem of the chip with high efficiency and high probability.

关 键 词：安全芯片 多模块 随机组合 密钥 加密 解密 可编程逻辑阵列 

分 类 号：TN06[电子电信—物理电子学]