辐照和注入条件下HEMP对电话机的损伤效应研究  

Damage effects of HEMP on telephones under irradiation and injection conditions

作　　者：杨杰 李跃波 黄刘宏 邓双 YANG Jie;LI Yuebo;HUANG Liuhong;DENG Shuang(Defense Engineering Institute,AMS,PLA,Luoyang 471023,China)

机构地区：[1]军事科学院国防工程研究院,河南洛阳471023

出　　处：《防护工程》2024年第2期14-18,共5页Protective Engineering

摘　　要：辐照法和注入法是研究电磁脉冲对电子信息设备损伤效应的有效试验方法,目前设备级效应试验基本只能利用单独一种方法进行研究。基于研制的辐照和注入同步试验设备,开展了HEMP对电话机的单独辐照、单独注入和辐照注入同步损伤效应试验研究,并对试验研究结果进行了对比分析,得到了辐照和注入试验的损伤阈值,为后期系统研究辐照和注入同步条件下HEMP对各种电子信息设备的损伤效应提供了方法参考。Irradiation and injection methods are effective experimental techniques for studying the damage effects of electromagnetic pulses on electronic information equipment.Currently,equipment-level effect experiments can generally only utilize a single method for research.Based on the developed synchronous irradiation and injection test equipment,experiments were conducted to study the damage effects of HEMP on telephones under separate irradiation,separate injection,and synchronous irradiation and injection conditions.Comparative analysis of the experimental results was performed to obtain the damage thresholds for irradiation and injection tests.This provides a method reference for subsequent systematic studies on the damage effects of HEMP on various electronic information equipment under synchronous irradiation and injection conditions.

关 键 词：HEMP 电话机 辐照注入同步 损伤效应 

分 类 号：TN03[电子电信—物理电子学]