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作 者:闫畅 范文杰 汪大淼 张文璋 YAN Chang;FAN Wenjie;WANG Damiao;ZHANG Wenzhang(Key Laboratory of Microwave Remote Sensing,National Space Science Center,Chinese Academy of Sciences,Beijing 100190,China;School of Astronomy and Space Science,University of Chinese Academy of Sciences,Beijing 100049,China;School of Aeronautics and Astronautics,University of Chinese Academy of Sciences,Beijing 100049,China;Key Laboratory of Electronics and Information Technology for Space Systems,Chinese Academy of Sciences,Beijing 100190,China)
机构地区:[1]中国科学院国家空间科学中心微波遥感技术重点实验室,北京100190 [2]中国科学院大学天文与空间科学学院,北京100049 [3]中国科学院大学航空宇航学院,北京100049 [4]中国科学院国家空间科学中心复杂航天系统电子信息技术重点实验室,北京100190
出 处:《机械设计与研究》2024年第6期16-20,共5页Machine Design And Research
基 金:国家科技重大专项(2021000124)。
摘 要:电子设备结构结合面中的频变法向接触刚度对其内部的电路板动力学特性影响较大,为了探究电子设备不同结合面上法向接触刚度对设备内部电路板的影响以及频变法向接触刚度的有限元建模方法,采用试验与仿真结合的方法开展了研究。首先,为了对结构中不同结合面法向接触刚度对电子设备的影响进行研究,设计了4种不同接触状态的工况,并对每种工况下的电子设备进行相同激励条件的频响试验;然后在电子设备的有限元分析中考虑法向接触刚度,针对不同接触工况采用BUSH单元对法向接触刚度进行建模,并根据试验结果对BUSH单元进行随频率变化的变刚度设置。试验结果验证了电子设备结构中的法向接触刚度对电子设备的振动响应具有明显影响;之后,通过在仿真分析中考虑法向接触刚度以及接触刚度的频变特性,实现了仿真分析结果与试验结果较好的吻合。The frequency-dependent normal contact stiffness at the structural interfaces in electronic equipment has a significant impact on the dynamic characteristics of the internal circuit boards.To investigate the influence of normal contact stiffness at different interfaces on the internal circuit boards of electronic equipment and the finite element modeling method for frequency-dependent normal contact stiffness,research is conducted using a combination of experiments and simulations.First,to study the impact of normal contact stiffness at different interface junctions on electronic equipment,four different contact conditions are designed,and frequency response tests under the same excitation conditions are carried out on electronic equipment for each condition.Next,the normal contact stiffness is considered in the finite element analysis of electronic devices,and the BUSH element is used to model the normal contact stiffness for different contact conditions,adjusting the stiffness of the BUSH element with frequency change according to experimental results.The experimental results confirm that the normal contact stiffness in the structure of electronic devices has a noticeable influence on the vibration response of the devices.Subsequently,by considering the frequency-dependent characteristics of the normal contact stiffness as well as its frequency variability in the simulation analysis,a good agreement is achieved between the simulation analysis results and the experimental findings.
分 类 号:TH113.1[机械工程—机械设计及理论]
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