基于改进EK算法的FPGA内部互联自动化测试方法  

An Automatic Test Method for FPGA Interconnect Resource Based on An Improved EK Algorithm

作　　者：傅僈喃 陈苏婷[1] 解维坤[2] 林晓会 FU Mannan;CHEN Suting;XIE Weikun;LIN Xiaohui(School of Electronics and Information Engineering,Nanjing University of Information Science and Technology,Nanjing 210042,China;The 58th Research Institute,China Electronics Technology Group Corporation,Wuxi 214035,China)

机构地区：[1]南京信息工程大学电子与信息工程学院,江苏南京210042 [2]中国电子科技集团公司第58研究所,江苏无锡214035

出　　处：《电子科技》2025年第2期10-16,共7页Electronic Science and Technology

基　　金：国家自然科学基金(62272234)。

摘　　要：在现场可编程门阵列(Field Programmable Gate Array,FPGA)互联资源(Interconnect Resource,IR)测试中,现存测试方法存在测试向量配置次数多、测试复杂度高且测试效率低等问题。为减少配置次数和提高测试效率,文中提出一种基于改进EK(Edmonds-Karp)算法的FPGA内部互联自动化测试方法。该方法将EK算法中寻找从源点s到终点t最短路径的增广路径改为寻找s到t最长路径的增广路径,以此减少配置次数。根据FPGA内部底层互联资源结构建立模型,将改进EK算法应用到Kintex-7系列FPGA中进行自动化布线路径搜索,并将布线路径配置进FPGA进行仿真实验。实验结果表明,相较于现存测试方法,所提方法在不减小故障覆盖率的同时能够以较少的配置次数检测出FPGA内互联资源的开路故障、短路故障和固定型故障。In the FPGA(Field Programmable Gate Array)IR(Interconnect Resource)testing,existing testing methods have problems such as multiple test vector configurations,high testing complexity,and low testing efficiency.In order to reduce the number of configurations and improve the efficiency of testing,an automatic test method for FPGA IR based on an improved EK(Edmonds-Karp)algorithm is proposed.This method achieves the goal of reducing the number of configurations by changing the search for the shortest path from the source point s to the endpoint t in the EK algorithm to the search for the longest path from s to t.A model based on the internal underlying IR structure of the FPGA is established,the improved EK algorithm is applied to the Kinex-7 series FPGA for automated routing path search,and the routing path is configured into the FPGA for simulation experiments.The experimental results show that the proposed method can detect the open circuit fault,short circuit fault and fixed fault in FPGA with less configuration times without reducing the fault coverage.

关 键 词：FPGA互联资源 配置次数 测试向量 自动化测试 Edmonds-Karp算法 增广路径 故障覆盖率 测试效率 

分 类 号：TN47[电子电信—微电子学与固体电子学]