一种新型IGCT门极驱动单元设计  

The Design of a Novel Gate Unit of Integrated Gate Commutated Thyristor

作　　者：向聪 汪涛[1] 李乐乐[1] 刘彬[1] XIANG Cong;WANG Tao;LI Le-le;LIU Bin(Nanjing NR Electric Co.,Ltd.,Nanjing 211102,China)

机构地区：[1]南京南瑞继保电气有限公司,江苏南京211102

出　　处：《电力电子技术》2025年第2期119-124,共6页Power Electronics

基　　金：国家重点研发计划(2023YFB2405900)。

摘　　要：门极驱动单元(GU)是集成门极晶闸管(IGCT)的重要组成部分,GU需具备主驱动控制(强触发开通、维持导通、门极换流关断)、状态检测、逻辑监测等功能。为了满足大功率等级IGCT器件开关性能的要求以及电网特殊应用工况,本文优化门极电流续流拓扑、改进铜皮硬压搭接的分离式方案、优化关断电容组合,提出了一种具备快速响应、黑启动、可拆卸、高可靠性的新型IGCT门极驱动单元。本文搭建了开通能力测试平台、脉冲测试平台和功率对推测试平台,对所提GU的高性能和可靠性进行了验证,研究结果可为非对称IGCT(AS-IGCT)在后续的柔性直流电网中的工程应用提供参考。The gate unit(GU)is an important component of integrated gate commutated thyristor(IGCT).The GU should be equipped with the"hard drive",status detection,logic monitoring,and other functions.In order to meet the require-ments of high-power IGCT device switching performance and special application conditions in the power grid,this let-ter optimizes the gate current freewheeling topology,improves the separation scheme of copper skin hard voltage over-lap,optimizes the combination of turnoff capacitors,and proposes a new type of IGCT gate drive unit with fast re-sponse,black start,detachable,and high reliability.Finally,this letter builds a capability testing platform,a pulse test-ing platform and a power cycling platform to verify the performance and reliability of GU.The results can provide ref-erence for the engineering application of AS-IGCT in subsequent flexible DC power grids.

关 键 词：集成门极晶闸管 门极驱动单元 器件 

分 类 号：TN89[电子电信—信息与通信工程]