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作 者:Guoqiang Ma Qin Tan Zhaoning Li Jingwei Xiu Jiafeng Wang Tianle Cheng Dong He Qiang Sun Xuhang Ma Francesco Lamberti Zhubing He
机构地区:[1]Department of Materials Science and Engineering,Institute of Innovative Materials(I2M),Shenzhen Key Laboratory of Full Spectral Solar Electricity Generation(FSSEG),Southern University of Science and Technology(SUSTech),Shenzhen 518055,Guangdong,China [2]Core Research Facilities,Southern University of Science and Technology,Shenzhen 518055,Guangdong,China [3]Department of Chemical Sciences,Department of Industrial Engineering,University of Padova,Via Gradenigo 6a,35131 Padova,Italy
出 处:《Journal of Energy Chemistry》2025年第1期348-355,共8页能源化学(英文版)
基 金:National Natural Science Foundation of China (NSFC)(52273266, U2001216);Shenzhen Science and Technology Innovation Committee (20231121102401001);Shenzhen Key Laboratory Project (ZDSYS201602261933302);GuangdongHong Kong-Macao Joint Laboratory on Micro-Nano Manufacturing Technology (2021LSYS004);SUSTech high level special funds (G03050K002)。
摘 要:Widely used spin-coated nickle oxide (NiOx) based perovskite solar cells often suffer from severe interfacial reactions between the NiOxand adjacent perovskite layers due to surface defect states,which inherently impair device performance in a long-term view,even with surface molecule passivation.In this study,we developed high-quality magnetron-sputtered NiOxthin films through detailed process optimization,and compared systematically sputtered and spin-coated NiOxthin film surfaces from materials to devices.These sputtered NiOxfilms exhibit improved crystallinity,smoother surfaces,and significantly reduced Ni3+or Ni vacancies compared to their spin-coated counterparts.Consequently,the interface between the perovskite and sputtered NiOxfilm shows a substantially reduced density of defect states.Perovskite solar cells (PSCs) fabricated with our optimally sputtered NiOxfilms achieved a high power conversion efficiency (PCE) of up to 19.93%and demonstrated enhanced stability,maintaining 86.2% efficiency during 500 h of maximum power point tracking under one standard sun illumination.Moreover,with the surface modification using (4-(2,7-dibromo-9,9-dimethylacridin-10(9H)-yl)butyl)p hosphonic acid (DMAcPA),the device PCE was further promoted to 23.07%,which is the highest value reported for sputtered NiOxbased PSCs so far.
关 键 词:Nickle oxide Magnetron sputter DEFECT Stability Perovskite solar cell
分 类 号:TM914.4[电气工程—电力电子与电力传动] TQ138.13[化学工程—无机化工]
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