基于国产芯片车规应用的测试评价体系研究  

Research on Test and Evaluation System of Automotive Application for Domestic Chip

作　　者：王彪 赵玮杰 周能辉 赵春明 Wang Biao;Zhao Weijie;Zhou Nenghui;Zhao Chunming

机构地区：[1]天津易鼎丰动力科技有限公司,天津300380 [2]新加坡南洋理工大学电气与电子工程学院,新加坡639798

出　　处：《时代汽车》2025年第2期13-15,共3页Auto Time

摘　　要：国产芯片基础研究薄弱,车规应用经验不足,目前主要应用在车窗、照明冷却系统等相对简单的控制功能领域。为有效保证国产芯片方案域控制器的可靠性,本文章开展了基于国产芯片车规应用的芯片级别、系统级别、整车级别三层级测试流程,并提出“五维度”案例生成规则及方法,建立了全类别、全工况、全周期、全参数的国产车规芯片测试评价体系,为国产芯片的车规应用提供了基础化支撑体系。The basic research on domestic chips is weak,and there is insufficient experience in automotive-grade applications.Currently,they are mainly applied in relatively simple control function fields such as car windows,lighting,and cooling systems.In order to effectively ensure the reliability of domestic chip solutions for domain controllers,this article has carried out a three-tier testing process at the chip level,system level,and whole vehicle level for automotive-grade applications for domestic chips.It also proposes a"five-dimensional"case generation rule and method,establishing a comprehensive testing and evaluation system for domestic automotive-grade chips that covers all categories,all conditions,the entire cycle,and all parameters.This provides a foundational support system for the automotive application of domestic chips.

关 键 词：国产芯片 车规应用 测试评价体系 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]