Nor Flash可靠性同测系统设计方法与实现  

Design Method and Implementation of Nor Flash Reliability Testing System

作　　者：董攀 王延斌 DONG Pan;WANG Yan-bin(CEC Huada Electronic Design Co.,Ltd,Beijing Key Laboratory of RFID Chip Test Technology)

机构地区：[1]北京中电华大电子设计有限责任公司,射频识别芯片检测技术北京市重点实验室

出　　处：《中国集成电路》2024年第12期75-80,共6页China lntegrated Circuit

摘　　要：本文首先介绍了Nor Flash的广泛应用以及可靠性评价的重要性,对目前评价方法和系统装置存在的缺点进行了分析。并针对Nor Flash当前的应用场景进行分析继而设计和实现了一套Nor Flash可靠性测试系统,最后对该系统在射频识别芯片检测技术北京市重点实验室进行了验证,并对其不足提出了未来发展建议。This paper first introduces the widespread application of Nor Flash and the importance of reliability evalu-ation,and analyzes the shortcomings of current evaluation methods and system devices.And based on the analysis of the current application scenarios of Nor Flash,a Nor Flash reliability testing system was designed and implemented.Finally,the system was validated in the Beijing Key Laboratory of RFID chip detection technology,and future devel-opment suggestions were proposed for its shortcomings.

关 键 词：闪存 USB集线器 可编程逻辑阵列 微控制器 物联网 

分 类 号：TP3[自动化与计算机技术—计算机科学与技术]