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作 者:马骏 朱杰 Ma jun;Zhu jie(Nantong Institute of Metrological Inspection and Testing;Nanjing Institute of Measurement and Testing Technology)
机构地区:[1]南通市计量检定测试所 [2]南京市计量监督检测院
出 处:《上海计量测试》2024年第6期79-81,84,共4页Shanghai Measurement and Testing
摘 要:致力于探究退火工艺对NTC热敏电阻、PT100铂热电阻以及PT1000铂热电阻温度传感器性能的影响。首先通过理论分析系统地介绍了这三种常用温度传感器的基本特性及其相互之间的差异。在此基础上,进一步探讨了退火工艺如何改变这些传感器的温度响应特性。实验部分详细描述了实验设计流程、退火处理的具体条件以及数据采集的方法。通过对实验数据的深入分析和讨论,揭示了退火工艺对不同传感器电阻温度特性、长期稳定性以及响应速度的影响。This study is devoted to investigate the effect of annealing process on the performance of NTC thermistors,platinum resistors PT100 and platinum resistors PT1000 temperature sensors.Firstly,the basic characteristics of these three commonly used temperature sensors and the differences between them are systematically introduced through theoretical analysis.On this basis,this study further explores how the annealing process changes the temperature response characteristics of these sensors.The experimental part describes in detail the experimental design flow,the specific conditions of the annealing process,and the method of data acquisition.Through in-depth analysis and discussion of the experimental data,the effects of the annealing process on the resistance temperature characteristics,long-term stability,and response speed of different sensors are revealed.
分 类 号:TP2[自动化与计算机技术—检测技术与自动化装置]
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