SoC数字测试机高精度脉冲边沿设计技术研究  

Research on high precision pulse edge design technology of SoC digital tester

作　　者：钟锋浩 ZHONG Feng-hao(Hangzhou Changchuan Technology Co.,Ltd.)

机构地区：[1]杭州长川科技股份有限公司

出　　处：《中国集成电路》2025年第1期70-74,共5页China lntegrated Circuit

摘　　要：集成电路数字测试机最关键的核心技术是数字测试模块技术,其技术性能直接决定了数字测试机的技术能力。数字测试模块的关键技术指标是测试速度和向量深度,其中测试速度的提升和稳定性直接决定了整个数字测试机的能力。本文从数字模块的基本原理分析,探讨数字测试模块时钟及数字信号边沿控制技术,对数字通道信号边沿对齐同步做了技术分析,对数字测试机的整体技术能力提升提供了有效的帮助。The most critical core technology of integrated circuit digital testing machine is digital test module technology,its technical performance directly determines the technical ability of digital testing machine,the key technical indicators of digital testing module is the test speed and vector depth,which the test speed and stability directly determines the ability of the entire digital testing machine.This paper analyzes the basic principle of digital module,discusses the digital test module clock and digital signal edge control technology,and makes technical analysis of digital channel signal edge alignment synchronization,which provides effective help to improve the overall technical ability of digital test machine.

关 键 词：数字测试机 数字信号 脉冲边沿 信号同步 

分 类 号：TN47[电子电信—微电子学与固体电子学]