高速集成电路的信号完整性测试方法  

Research on Signal Integrity Testing of High-Speed Integrated Circuit

作　　者：李华[1] 曹晓斌 LI Hua;CAO Xiaobin(No.58 Research Institute,China Electronics Technology Group Corporation,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第五十八研究所,江苏无锡214035

出　　处：《通信电源技术》2025年第3期46-48,共3页Telecom Power Technology

摘　　要：系统地阐述了高速集成电路中信号完整性的测试方法及其应用。首先,针对高频信号的衰减机制、非线性失真、设计规则及动态串扰等问题进行深入分析;其次,详细介绍信号完整性测试方法,包括时域测试、频域测试及混合域测试;再次,提出完整的信号完整性测试流程,包括测试准备、测试方法设计以及如何根据测试结果进行优化;最后,通过优化前后的对比分析,展示了优化策略在实际测试中的效果,可有效提升电路的信号完整性。The testing method of signal integrity in high-speed integrated circuits and its application are systematically expounded.Firstly,the attenuation mechanism,nonlinear distortion,design rules and dynamic crosstalk of high frequency signals are deeply analyzed.Secondly,the signal integrity testing methods are introduced in detail,including time domain testing,frequency domain testing and mixed domain testing.Thirdly,a complete signal integrity test process is proposed,including test preparation,test method design and how to optimize according to the test results.Finally,through the comparative analysis before and after optimization,the effect of the optimization strategy in the actual test is demonstrated,which can effectively improve the signal integrity of the circuit.

关 键 词：高速集成电路 信号完整性 时域测量 频域测量 

分 类 号：TN9[电子电信—信息与通信工程]