静电敏感性试验及其应用研究  

Electrostatic Discharge Sensitivity Testing and Its Application Research

作　　者：张喆垚 田常湘 曾娅秋 裴昊 曾棋 谭海庆 ZHANG Zhe-yao;TIAN Chang-xiang;ZENG Ya-qiu;PEI Hao;ZENG Qi;TAN Hai-qing(China Electronics Technology Chip Research Institute,Chongqing 400060)

机构地区：[1]中国电科芯片技术研究院,重庆400060

出　　处：《环境技术》2025年第1期84-89,共6页Environmental Technology

摘　　要：静电敏感测试(ESD测试),广泛用于评估电子元器件和设备在遭受静电放电(ESD)冲击时的耐受能力,是电子元器件设备设计、制造和质量控制中必不可少的测试手段之一。随着现代电子产品的微型化、集成化及高速化,静电放电的威胁日益增大,且对设备的影响更加复杂。为了保证产品的可靠性和稳定性,开展有效的静电敏感性试验显得尤为重要。本文介绍了静电敏感性试验的基本原理、方法、影响因素及面临的挑战,并探讨了其发展前景。Electrostatic Discharge Sensitivity Testing(ESD testing)is widely used to evaluate the tolerance of electronic components and devices to electrostatic discharge(ESD)impacts.It is one of the essential testing methods in the design,manufacturing,and quality control of electronic components and devices.With the miniaturization,integration,and high-speed development of modern electronic products,the threat of electrostatic discharge has become increasingly significant,and its impact on devices is becoming more complex.To ensure the reliability and stability of products,conducting effective electrostatic sensitivity testing is of paramount importance.This paper introduces the basic principles,methods,influencing factors,and challenges of electrostatic sensitivity testing,and explores its future development prospects.

关 键 词：静电敏感性试验 高频设备 可靠性 测试标准 

分 类 号：TN406[电子电信—微电子学与固体电子学]