Event-Triggered Fault Detection——An Integrated Design Approach Directly Toward Fault Diagnosis Performance  

作　　者：Aibing Qiu Yu Hu Jingsong Wu 

机构地区：[1]the School of Electrical Engineering,Nantong University,Nantong 226019,China [2]the Shanghai Key Laboratory of Power Station Automation Technology,the School of Mechatronic Engineering and Automation,Shanghai University,Shanghai 200444,China

出　　处：《IEEE/CAA Journal of Automatica Sinica》2024年第12期2528-2530,共3页自动化学报(英文版)

基　　金：supported by the National Natural Science Foundation of China(62273188,U2066203);the“Qinglan Project”of Jiangsu Colleges and Universities。

摘　　要：Dear Editor,This letter investigates an integrated design approach directly toward fault diagnosis performance for event-triggered systems.By evaluating the effects of all external inputs on residual under the event-triggered mechanism,the event-triggered false alarm rate(FAR)and fault detection rate(FDR)are defined and their relationship is established.Based on this,the residual generation and evaluation are designed in an integrated manner to maximize temp FDR for a given FAR with the help of linear matrix inequality(LMI)and an iterative algorithm.

关 键 词：INEQUALITY LETTER false 

分 类 号：TP277[自动化与计算机技术—检测技术与自动化装置]