基于自适应曝光时间序列的谱图校正算法  

Spectral correction algorithm based on adaptive exposure time series

作　　者：王楗 关丛荣 陈吉文 Wang Jian;Guan Congrong;Chen Jiwen(North China University of Technology,Beijing 100144,China)

机构地区：[1]北方工业大学,北京100144

出　　处：《分析仪器》2025年第1期91-97,共7页Analytical Instrumentation

基　　金：科技部重点研发计划(2021YFF0700102)。

摘　　要：针对电感耦合等离子体(ICP)中阶梯光栅光谱仪数据采集过程中,单一固定曝光时间带来的信息丢失问题,设计了一种基于自适应曝光时间序列的谱图校正算法。通过使用评估曝光时间采集一帧谱图数据,自适应计算每条特征谱线的理想曝光时间,建立理想曝光时间序列并进行优化。利用优化后的曝光时间序列采集多帧谱图,基于校正算法进行线性校正并归一化为c/s(每秒ADU)进行后续分析。实验结果表明,在相同的实验条件下,算法校正后的Zn、Mn、Cr、Ba元素谱线的二维谱图无过曝现象,成像形状更为合理,谱图信噪比均有所提升,校正后的Zn、Ni、Mn、Cr元素特征谱线强度建立的标准曲线的线性相关系数R^(2)均高于0.999,与校正前相比有显著提升。Aiming at the problem of the impact of exposure time on the imaging of the two-dimensional spectrum of element characteristic spectral lines and subsequent quantitative analysis results during the data collection process of the inductively coupled plasma(ICP)echelle spectrometer,a spectral correction algorithm based on adaptive exposure time series was designed.By using the evaluation exposure time to collect one frame of spectral data,the ideal exposure time for each element's characteristic spectral line were adaptively calculated to establish a sequence and optimize it.The optimized exposure time sequence was used to collect multiple frames of spectra,and perform linear correction and integration based on the correction algorithm,convert to c/s(ADU per second)for subsequent analysis.The test results verified that under the same experimental conditions,the two-dimensional spectra of Zn,Mn,Cr,and Ba element spectral lines corrected by the algorithm were not overexposed,and the imaging shape was more reasonable,and the spectrum signal-to-noise ratio were all improved.The linear correlation coefficients R^(2) of the standard curves established by the characteristic spectral line intensities of Zn,Ni,Mn,and Cr elements after correction were all higher than 0.999,which were significantly improved compared with that before correction.

关 键 词：中阶梯光栅光谱仪 曝光时间 谱图校正 定量分析 

分 类 号：O211.61[理学—概率论与数理统计] TP274.2[理学—数学] TH744.1[自动化与计算机技术—检测技术与自动化装置]