Tecnai T12型透射电子显微镜载网落入镜筒的故障排查及修复  

Troubleshooting and maintenance of the occurrence of grid falling into the column of Tecnai T12 transmission electron microscopy

作　　者：孙晶莹 姜隆[1] 梁超伦[1] Sun Jingying;Jiang Long;Liang Chaolun(Instrumental Analysis and Research Center,Sun Yat-sen University,Guangzhou,510275,China)

机构地区：[1]中山大学分析测试中心,广州510275

出　　处：《分析仪器》2025年第1期104-108,共5页Analytical Instrumentation

摘　　要：针对目前进口精密设备维修和维护不便的问题,以FEI Tecnai T12型透射电子显微镜单倾样品杆压环脱落导致载网落入镜筒的维修案例,介绍了一种自主修复方法。通过电子光路原理分析铜网位置,简便取出铜网,缩短了维修时间。此外,采用环氧树脂修复破损样品杆,节约了维修成本。该方法为TEM自主故障判断、自主维护提供参考,期望形成有效的维修策略,提高仪器使用效率,更好地服务于教学和科研。With the rapid development of material science,transmission electron microscopy(TEM)has become an indispensable analysis instrument to reveal the physical-chemical properties and the microstructure of the materials.How to independently maintain,repair and default of the imported TEM has become the problem demanding prompt solution.Aiming to alleviate the issue,a maintenance case of detached copper grid in single tilt sample holder that fell into the column of Tecnai T12 TEM are introduced.Utilizing the principles of electron optics to deduce the position of the copper grid in column has facilitated its extraction,thereby abbreviating the maintenance time.Moreover,the application of epoxy resin for the repair of fractured sample holder has curtailed maintenance costs.This approach serves as a reference for the autonomous fault diagnosis and maintenance of TEM.It is hopeful that this will draw some enlightenments to enhance the instrumental usage efficiency and better serve teaching and scientific research.

关 键 词：透射电子显微镜 样品杆损坏 载网掉落 自主维修 

分 类 号：TN16[电子电信—物理电子学]