基于AD9957的自动化测试系统设计  

Design of automatic test system based on AD9957

作　　者：于吉刚 赵子龙 YU Jigang;ZHAO Zilong(No.58 Research Institute,China Electronics Technology Group Corporation,Wuxi 214035,China)

机构地区：[1]中国电子科技集团公司第58研究所,江苏无锡214035

出　　处：《中国测试》2024年第S2期137-140,共4页China Measurement & Test

摘　　要：为满足AD9957批量出厂的自动化检测要求,设计了一种基于DDS通用测试平台的AD9957子卡,实现对AD9957快速的动态性能指标测试,自动化测试中采用的频谱分析仪和信号源通过上位机软件LabVIEW实现对仪器的自动化控制,基于LabVIEW编写的上位机软件可以实现对测试芯片AD9957的一键自动化测试,对测试不合格的芯片直接弹窗提示,测试完成会自动生成和保存设计需求的动态指标数据,该文主要针对AD9957子卡的硬件设计、动态性能指标测试方法和自动化测试系统的搭建进行详细的阐述,通过对比手册给出的典型动态指标,最终确定该文设计的子卡性能可以满足AD9957的一键自动化性能指标测试应用。In order to meet the chip AD9957 batch factory automatic testing requirements,designed a kind of DDS based on the general test platform AD9957 sub-card,realize the rapid dynamic performance index test of AD9957,the frequency spectrum analyzer and signal source used in the automatic test through the host computer software LabVIEW to achieve automatic control of the instrument,the host computer software based on LabVIEW can realize the test chip AD9957 one-key automatic test,the test of unqualified chip directly pop-up prompts,the test will automatically generate and save the dynamic index data of design requirements,this design mainly for AD9957 sub-card hardware design,dynamic performance index test method and automatic test system building detailed elaboration,through the comparison of the manual given typical dynamic index,the final determination of the performance of the sub-card designed in this paper can meet the AD9957 one-key automatic performance index test application.

关 键 词：自动化测试 LABVIEW AD9957 动态指标 

分 类 号：TP274[自动化与计算机技术—检测技术与自动化装置] TH702[自动化与计算机技术—控制科学与工程]