全电子引信抗过载研究现状  

Anti-overload Research Status Quo of Electronic Safety and Arm Fuze

作　　者：汪柯 郑监 施长军[1] 郭莎[1] 任新联[1] 胡宏伟[1] WANG Ke;ZHENG Jian;SHI Changjun;GUO Sha;REN Xinlian;HU Hongwei(Xi'an Modern Chemistry Research Institute,Xi'an 710065,China)

机构地区：[1]西安近代化学研究所,陕西西安710065

出　　处：《探测与控制学报》2025年第1期15-23,共9页Journal of Detection & Control

摘　　要：全电子引信具有高安全性和可靠性,实现其在高过载环境中的应用是发展的重要方向之一,提高全电子引信在侵彻等高过载环境中的生存能力是当前的研究重点。介绍了国内外全电子引信的研究和应用现状,从元器件、灌封、结构、装药、先进工艺等角度介绍了全电子引信的抗过载手段。元器件抗过载设计是提高引信抗过载能力的根本方法,灌封和缓冲结构设计是当前提高引信抗过载能力的重要手段。利用增材制造、MEMS等先进工艺实现元器件的小型化和集成化是发展的重要方向。Because of the high security and reliability of all-electron safety and arm fuze,the application of all-electron fuze in high-overload environment is one of the important directions of development,so improving the survivability of all-electron fuze in high-overload environment such as penetration is the current research focus of all-electron fuze.This paper introduced the research and application status quo of all-electronic fuze at home and abroad,and introduced the anti-overload means of all-electronic fuze from the aspects of components,filling,structure and charge.The anti-overload design of components was the fundamental method to improve the anti-overload capability of fuze,and the potting and structural design were the primary means to improve the anti-overload capability of fuze.The use of advanced processes such as additive manufacturing and MEMS to achieve miniaturization and integration of components was an important direction of development.

关 键 词：全电子引信 抗过载 小型化 

分 类 号：TJ430[兵器科学与技术—火炮、自动武器与弹药工程]