基于开尔文探针力显微镜探究半导体光催化剂的表面电势分布  

Experimental study on potential distribution of semiconductor photocatalysts based on Kelvin probe force microscopy

作　　者：崔丹丹 李其熠 任祉臻 冯海凤 郝维昌[1] 金硕[1] CUI Dandan;LI Qiyi;REN Zhizhen;FENG Haifeng;HAO Weichang;JIN Shuo(School of Physics,Beihang University,Beijing 100191,China)

机构地区：[1]北京航空航天大学物理学院,北京100191

出　　处：《物理实验》2025年第1期21-27,共7页Physics Experimentation

基　　金：北京市北京高等教育本科教学改革创新项目(No.202210006003);北京航空航天大学重点教改项目;北京航空航天大学教改项目;高等学校理论力学课程教学研究项目。

摘　　要：开尔文探针力显微镜能够通过探针与样品之间的接触电势差来获取样品的功函数和表面电势分布图.为充分发挥近代物理实验课程培养学生自主创新实践能力的作用,增设了开尔文探针力显微镜技术实验.实验选取典型的半导体光催化剂TiO_(2)和BiVO_(4)为测试对象,通过在暗态和可见光照条件下测试样品表面电势的变化,获得不同带隙半导体材料在可见光下的表面电势分布.测试过程中,通过改变光照条件,观察样品表面电势的变化,使学生深入理解光催化反应过程中载流子的行为,进一步探究异质结对催化剂表面电势的影响,深入理解功函数以及光催化过程中内建电场的作用.Kelvin probe force microscopy(KPFM)can measure the work function and surface potential distribution of a sample by detecting the contact potential difference(CPD)between the probe and the sample.To enhance the role of modern physics experiments in fostering students’independent innovation and practical skills,a Kelvin probe force microscopy(KPFM)experiment was introduced.Typical semiconductor photocatalysts TiO_(2)and BiVO_(4)were selected as the test objects.Through the test of the surface potential changes of the sample under dark and visible light conditions,the distribution of surface carriers of different band gap semiconductor materials under visible light was obtained.During the scanning process,the variations in the surface potential could be observed with the change of the lighting conditions.The experimental procedure enabled students to gain a deeper understanding of charge carrier behavior in photocatalytic reactions.Additionally,it allowed for the investigation of heterojunction effects on catalyst surface potential,as well as a more accurate understanding of work function and the role of built-in electric fields in photocatalytic processes.

关 键 词：开尔文探针力显微镜 半导体光催化剂 电势分布 

分 类 号：TL341[核科学技术—核技术及应用]