片上光阱中悬浮微球的带电量测量技术(特邀)  

Charge Measurement of Levitated Microspheres in Optical Trap Chip(Invited)

作　　者：冯海宁 金世龙 陈鑫麟 李国锋 饶思源 曾炜卿 熊威 韩翔 肖光宗 罗晖[1,2] Feng Haining;Jin Shilong;Chen Xinlin;Li Guofeng;Rao Siyuan;Zeng Weiqing;Xiong Wei;Han Xiang;Xiao Guangzong;Luo Hui(College of Advanced Interdisciplinary Studies,National University of Defense Technology,Changsha 410073,Hunan,China;Nanhu Laser Laboratory,National University of Defense Technology,Changsha 410073,Hunan,China)

机构地区：[1]国防科技大学前沿交叉学科学院,湖南长沙410073 [2]国防科技大学南湖之光实验室,湖南长沙410073

出　　处：《光学学报(网络版)》2024年第4期34-39,共6页Acta Optica Sinica(Online)

基　　金：湖南省自然科学基金杰出青年基金项目(2024JJ2055);湖南省重点科技攻关项目(2023ZJ1010)

摘　　要：在悬浮光力系统中,被捕获微粒的带电量将直接影响其对极弱力、重力、加速度、微质量和电场强度等物理参量的测量精度。设计了集成电极的双光束光阱芯片,提出了直流驱动法与交流驱动法两种测量粒子带电量的方法,采用全光纤的小型化系统捕获直径为10μm的二氧化硅微球,成功实现了该微球表面带电量的精确测量。测量结果表明,两种方法测量得到的二氧化硅微球表面的电荷数均为493,验证了这两种带电量测量方法的可靠性。In a levitated optomechanical system,the electric charge on the captured particle affects the sensitivity of measurements for force,gravity,acceleration,mass,and electric field.In this study,we propose and design a dual-beam optical trap chip with integrated electrodes to measure the charge on trapped particles using both direct current signaldriven electric fields and alternating current signal-driven electric fields.We successfully measure the precise charge of 10μm diameter silicon dioxide microspheres trapped in the chip using an all-fiber miniaturized system.The results show that both methods yield a charge number of 493 for the silicon dioxide microspheres,confirming the reliability of these charge measurement methods.

关 键 词：光镊 集成化芯片 带电量 微球 

分 类 号：O439[机械工程—光学工程]