基于化学反应的加速寿命试验基本原理及应用  

Basic Principles and Applications of Accelerated Life Testing Based on Chemical Reactions

作　　者：高海龙 侯旎璐 杨永兴[1] CAO Hailong;HOU Nilu;YANG Yongxing(CEPREI-EAST,Suzhou 215129,China)

机构地区：[1]工业和信息化部电子第五研究所华东分所,江苏苏州215129

出　　处：《电子产品可靠性与环境试验》2025年第1期33-37,共5页Electronic Product Reliability and Environmental Testing

摘　　要：寿命试验是芯片整体制造流程中不可或缺的一环,高温加速寿命试验可以大幅度缩短寿命试验周期,提高产品可靠性评估的效率。在开展高温加速寿命试验时,阿伦尼乌斯模型是最典型、应用得最广泛的加速模型,从物理化学角度介绍化学反应速率方程和阿伦尼乌斯方程及其在高温加速寿命试验中的应用,介绍了在温度和湿度2种加速因子的作用下,速率方程与Hallberg-Peck模型的相关性,通过实际验算过程,验证温度和湿度2种加速因子对寿命试验的加速作用。Life test is an indispensable part of the whole chip manufacturing process.High temperature accelerated life test can greatly shorten the life test cycle and improve the efficiency of product reliability evaluation.When carrying out high temperature acclerated life test,the Arrhenius model is the most typical and widely used acceleration model,the rate equation and Arrhenius equation and their application in the high temperature accelerated life test are introduced from the perspective of physical chemistry.The correlation between the rate equation and the Hallberg-Peck model under the action of temperature and humidity is introduced.The acceleration effect of temperature and humidity on the life test is also verified through the actual verification process.

关 键 词：高温加速寿命试验 阿伦尼乌斯模型 化学反应 速率方程 可靠性评估 温度 湿度 

分 类 号：TN406[电子电信—微电子学与固体电子学] TB114.37[理学—概率论与数理统计]