Experimental determination of stripping foil thickness on the XiPAF synchrotron  

在线阅读下载全文

作  者:Xiao-Yu Liu Hong-Juan Yao Shu-Xin Zheng Ze-Jiang Wang Yang Xiong Pei-Zhi Fang Zhong-Ming Wang 

机构地区:[1]Key Laboratory of Particle&Radiation Imaging,Tsinghua University,Beijing 100084,China [2]Laboratory for Advanced Radiation Sources and Application,Tsinghua University,Beijing 100084,China [3]Department of Engineering Physics,Tsinghua University,Beijing 100084,China [4]National Key Laboratory of Intense Pulsed Radiation Simulation and Effect,Northwest Institute of Nuclear Technology,Xi’an 710024,China

出  处:《Nuclear Science and Techniques》2025年第3期27-37,共11页核技术(英文)

摘  要:Stripping injection overcomes the limitations of Liouville's theorem and is widely used for beam injection and accumulation in high-intensity synchrotrons.The interaction between the stripping foil and beam is crucial in the study of stripping injection,particularly in low-energy stripping injection synchrotrons,such as the XiPAF synchrotron.The foil thickness is the main parameter that affects the properties of the beam after injection.The thin stripping foil is reinforced with collodion during its installation.However,the collodion on the foil surface makes it difficult to determine its equivalent thickness,because the mechanical measurements are not sufficiently reliable or convenient for continuously determining foil thickness.We propose an online stripping foil thickness measurement method based on the ionization energy loss effect,which is suitable for any foil thickness and does not require additional equipment.Experimental studies were conducted using the XiPAF synchrotron.The limitation of this method was examined,and the results were verified by comparing the experimentally obtained beam current accumulation curves with the simulation results.This confirms the accuracy and reliability of the proposed method for measuring the stripping foil thickness.

关 键 词:Stripping injection Foil thickness SYNCHROTRON Injection efficiency Experimental study 

分 类 号:TL5[核科学技术—核技术及应用]

 

参考文献:

正在载入数据...

 

二级参考文献:

正在载入数据...

 

耦合文献:

正在载入数据...

 

引证文献:

正在载入数据...

 

二级引证文献:

正在载入数据...

 

同被引文献:

正在载入数据...

 

相关期刊文献:

正在载入数据...

相关的主题
相关的作者对象
相关的机构对象