一种自检测快起振8 MHz CMOS 晶振电路设计  

A self-testing fast start-up 8 MHz CMOS oscillator circuit design

作　　者：陈小钰 郑迅 倪屹 CHEN Xiaoyu;ZHENG Xun;NI Yi(School of Integrated Circuits,Jiangnan University,Wuxi 214122,Jiangsu Province,China;Zhejiang Chituo Technology Co.,Ltd.,Wuxi 214122,Jiangsu Province,China)

机构地区：[1]江南大学集成电路学院,江苏无锡214122 [2]浙江驰拓科技有限公司,江苏无锡214122

出　　处：《电子元件与材料》2025年第1期71-78,共8页Electronic Components And Materials

基　　金：江苏省研究生实践创新计划(KYCX24_2511)。

摘　　要：在微处理器中,为了解决高速外部时钟源中传统的皮尔斯晶体振荡器起振时间长的问题,提出了一种自检测快起振8 MHz CMOS晶振电路。通过自启动电路到差分放大电路之间的电容建立正反馈回路,提升运算放大器的偏置电流,从而加快输出信号的响应时间。利用开关占空比整形电路完成波形整形与电平移位,实现内部集成电源到数字电源的转换。此外,为了确保晶振电路的精度和可靠性,设计了基于电容充放电与二分频电路的自检测机制,实现对频率的实时监控。电路采用90 nm 4P6M CMOS工艺制造,有效芯片面积为126μm×77μm。仿真及测试结果表明,在5 V电源电压下,电路能够在600μs内产生输出波形占空比为50.1%、频率为8 MHz的振荡信号,且工作电流为160μA。In microprocessors,a self-testing fast start-up 8MHz CMOS crystal oscillator circuit was proposed to solve the problem of long starting time of traditional Pierce crystal oscillators in high-speed external clock sources.A positive feedback loop was established through the capacitor between the self-start circuit and differential amplifier circuit in order to boost the bias current of the operational amplifier and speed up the response time of the output signal.The waveform shaping and level shifting were completed with the switching duty cycle shaping circuit,and the conversion from the internal integrated power supply to the digital power supply was realized.In addition,to ensure the accuracy and reliability of the crystal oscillator circuit,a self-detection mechanism based on capacitor charging and discharging and frequency division circuit was designed to realize real-time monitoring of the frequency.The circuit was fabricated using a 90 nm 4P6M CMOS process with an effective chip area of 126μm×77μm.The simulation and test results show that the circuit can generate an oscillating signal with the output waveform duty cycle of 50.1%and frequency of 8 MHz in 600μs under the supply voltage of 5 V and operating current of 160μA.

关 键 词：晶振电路 负阻增强 快速起振 差分放大 检测电路 

分 类 号：TN431.1[电子电信—微电子学与固体电子学]