一种防止电压暂降试验失效的蓄电池充电装置设计  

Design of a Battery Charging Device to Prevent Voltage Sag Test Failure

作　　者：闫亮 YAN Liang(Ningxia Baofeng Yuneng Technology Co.,Ltd.,Ningxia 750001,China)

机构地区：[1]宁夏宝丰昱能科技有限公司,宁夏750001

出　　处：《电子技术(上海)》2024年第12期26-27,共2页Electronic Technology

摘　　要：阐述在充电装置试验过程中,需要根据电磁兼容试验和测量技术电压暂降、短时中断和电压变化的抗扰度进行试验。提出一种改进型反激芯片驱动供电电路,可有效解决电压暂降试验失效的问题。This paper describes that in the process of charging device testing,it is necessary to conduct tests based on electromagnetic compatibility testing and measurement techniques for voltage sag,short-term interruption,and voltage variation immunity.It proposes an improved flyback chip driven power supply circuit that can effectively solve the problem of voltage sag test failure.

关 键 词：反激芯片驱动供电电路 电压暂降试验失效 充电装置试验 

分 类 号：TN86[电子电信—信息与通信工程]